Panel Discussion: Ionic Contamination Assessment in ECU Manufacturing

The discussion will deliberately consider both perspectives, including:

• The benefits of controlling ionic contamination in electronic assemblies
• ROSE‑based approaches for present and future ECU reliability requirements
• Technical strengths and limitations of IC, including reproducibility and uncertainty
• Approaches in defining and enforcing IC‑based ionic limits
• Implications for manufacturing processes, specifications, and supplier qualification
• Potential impact to supply‑chain

OEMs, tier suppliers, and solution providers will share perspectives on when increased analytical detail provides benefits. The discussion will focus on practical experience, historical context, and the balance between robustness, manufacturability, and cost.