Knowledge Hub
Your Gateway to Technical Knowledge Exchange for the Global Electronics Community
Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
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Pb-free Solder Joint Reliability in a Mildly Accelerated Test Condition
Two different temperature cycling profiles were used to compare the thermal fatigue reliability of Pb free and SnPb solder joints in 16 different,high strain surface mount (SMT) packages. In so
.. read more
An Efficient Test Model to Study the Board Level Reliability For High I/O Flip Chip BGA Packages
With the increasing demands of complex functions in a single chipset or microprocessor,the development of large
size high I/O Flip Chip BGA (FCBGA) package becomes very important in recent year
.. read more
Pb-free Solder Joint Reliability in a Mildly Accelerated Test Condition
Two different temperature cycling profiles were used to compare the thermal fatigue reliability of Pb free and SnPb solder joints in 16 different,high strain surface mount (SMT) packages. In so
.. read more
An Efficient Test Model to Study the Board Level Reliability For High I/O Flip Chip BGA Packages
With the increasing demands of complex functions in a single chipset or microprocessor,the development of large
size high I/O Flip Chip BGA (FCBGA) package becomes very important in recent year
.. read more