Knowledge Hub
Your Gateway to Technical Knowledge Exchange for the Global Electronics Community
Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
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IPC/IMEC/ESA Microvia TV CITC Test Results
IPC/IMEC/ESA Microvia TV CITC Outline
CITC Coupon and Test Plan Overview
CITC Test Introduction
Temperature Coefficient of Resistance (TCR) Test and Resul
.. read more
Thermal Stress Testing & Impact of High Thermal Excursion Pre-Conditioning on Cycles to Fail
Today both Interconnect Stress Test (IST) and Highly Accelerated Thermal Shock (HATS) test methods are used to measure
plated through hole via reliability. Both of these test methods have prove
.. read more
IPC/IMEC/ESA Microvia TV CITC Test Results
IPC/IMEC/ESA Microvia TV CITC Outline
CITC Coupon and Test Plan Overview
CITC Test Introduction
Temperature Coefficient of Resistance (TCR) Test and Resul
.. read more
Thermal Stress Testing & Impact of High Thermal Excursion Pre-Conditioning on Cycles to Fail
Today both Interconnect Stress Test (IST) and Highly Accelerated Thermal Shock (HATS) test methods are used to measure
plated through hole via reliability. Both of these test methods have prove
.. read more