Knowledge Hub
Your Gateway to Technical Knowledge Exchange for the Global Electronics Community
Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
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The Next RF Probing Challenge: IoT and 5G
IoT and 5G applications have theirchallenges when it comes to functional testing –especially for the probing part inside a functional test fixture(hereinafter referred to as “FCT” fixture).I
.. read more
Design for Testability (DFT) to Overcome Functional Board Test Complexities in Manufacturing Test
Manufacturers test to ensure that the product is built correctly. Shorts,opens,wrong or incorrectly inserted components,even catastrophically faulty components need to be flagged,found and repa
.. read more
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of Printed Circuit Board Assembly
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a component/devices in a printed circuit board assembly
.. read more
Early Design Review of Boundary Scan in Enhancing Testability and Optimization of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs. This makes it essenti
.. read more
Good Product Quality Comes From Good Design for Test Strategies
Product quality can be improved through proper application of design for test (DFT) strategies. With today’s shrinking product sizes and increasing functionality,it is difficult to get good tes
.. read more
Application Of Build-in Self Test In Functional Test Of DSL
1. What is BIST
2. What is DSL
3. DSL test items
4. Digital & Analog DSL test
5. BIST on DSL
6. Comparison & Benefits
.. read more
Testing DDR Memory
Testing DDR memories on Printed Circuit Boards has steadily gotten more difficult. Most such memories do not have any on-chip Design-for-Test features. Adequate test access is a disappearing lu
.. read more
The Socketless Revolution Larger Probes on Smaller Center Test Targets Application of the Socketless Probe Technology to PCB Manufacturing and...
As technology progresses,electronic components that do bigger and better things are hitting the market. At the same time,the size of the PCB is shrinking. While circuit board designers could re
.. read more
In-Circuit Test Probe Contact on Lead Free Printed Circuit Board Assemblies
The in-circuit test (ICT) of printed circuit boards (PCBs) assembled with Lead Free solder was anticipated to be problematic
by industry test engineers,due to contact failures associated with t
.. read more
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards to a Real-Life Product
Design for test rules (DFT) for in circuit test (ICT) test pads are well known and have served the industry well for nearly two
decades. However,increasing PCB densities continually put pressur
.. read more
A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test
This paper will discuss:
a. Boundary scan as a key test tool that enables the leveraged test approach
b. The advantages of standardizing and reusing design verification tests and PLD programs i
.. read more
The Next RF Probing Challenge: IoT and 5G
IoT and 5G applications have theirchallenges when it comes to functional testing –especially for the probing part inside a functional test fixture(hereinafter referred to as “FCT” fixture).I
.. read more
Design for Testability (DFT) to Overcome Functional Board Test Complexities in Manufacturing Test
Manufacturers test to ensure that the product is built correctly. Shorts,opens,wrong or incorrectly inserted components,even catastrophically faulty components need to be flagged,found and repa
.. read more
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of Printed Circuit Board Assembly
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a component/devices in a printed circuit board assembly
.. read more
Early Design Review of Boundary Scan in Enhancing Testability and Optimization of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs. This makes it essenti
.. read more
Good Product Quality Comes From Good Design for Test Strategies
Product quality can be improved through proper application of design for test (DFT) strategies. With today’s shrinking product sizes and increasing functionality,it is difficult to get good tes
.. read more
Application Of Build-in Self Test In Functional Test Of DSL
1. What is BIST
2. What is DSL
3. DSL test items
4. Digital & Analog DSL test
5. BIST on DSL
6. Comparison & Benefits
.. read more
Testing DDR Memory
Testing DDR memories on Printed Circuit Boards has steadily gotten more difficult. Most such memories do not have any on-chip Design-for-Test features. Adequate test access is a disappearing lu
.. read more
The Socketless Revolution Larger Probes on Smaller Center Test Targets Application of the Socketless Probe Technology to PCB Manufacturing and...
As technology progresses,electronic components that do bigger and better things are hitting the market. At the same time,the size of the PCB is shrinking. While circuit board designers could re
.. read more
In-Circuit Test Probe Contact on Lead Free Printed Circuit Board Assemblies
The in-circuit test (ICT) of printed circuit boards (PCBs) assembled with Lead Free solder was anticipated to be problematic
by industry test engineers,due to contact failures associated with t
.. read more
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards to a Real-Life Product
Design for test rules (DFT) for in circuit test (ICT) test pads are well known and have served the industry well for nearly two
decades. However,increasing PCB densities continually put pressur
.. read more
A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test
This paper will discuss:
a. Boundary scan as a key test tool that enables the leveraged test approach
b. The advantages of standardizing and reusing design verification tests and PLD programs i
.. read more