Knowledge Hub
Your Gateway to Technical Knowledge Exchange for the Global Electronics Community
Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
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New Product Introduction Process Integration
The world market is changing for the OEM,CEM,and electronic manufacturers. This changing market dictates that as a
global industry more focus is placed on reducing the time to market for “New P
.. read more
FPGA on Board
Whilst the number of new ASIC designs has decreased over the last couple of years,there has been a dramatic increase in the
number of FPGA designs implemented. Not only have the number of desig
.. read more
A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test
This paper will discuss:
a. Boundary scan as a key test tool that enables the leveraged test approach
b. The advantages of standardizing and reusing design verification tests and PLD programs i
.. read more
Lessons Learned from the IPC-2501 Testbed Prototype Performance Test at a Motorola Factory
The IPC 2501 Web Service Definition for the exchange of XML data provides an XML middleware integration
environment that enables the deployment of IPC Computer Aided Manufacturing using XML (CA
.. read more
New Product Introduction Process Integration
The world market is changing for the OEM,CEM,and electronic manufacturers. This changing market dictates that as a
global industry more focus is placed on reducing the time to market for “New P
.. read more
FPGA on Board
Whilst the number of new ASIC designs has decreased over the last couple of years,there has been a dramatic increase in the
number of FPGA designs implemented. Not only have the number of desig
.. read more
A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test
This paper will discuss:
a. Boundary scan as a key test tool that enables the leveraged test approach
b. The advantages of standardizing and reusing design verification tests and PLD programs i
.. read more
Lessons Learned from the IPC-2501 Testbed Prototype Performance Test at a Motorola Factory
The IPC 2501 Web Service Definition for the exchange of XML data provides an XML middleware integration
environment that enables the deployment of IPC Computer Aided Manufacturing using XML (CA
.. read more