Knowledge Hub

Your Gateway to Technical Knowledge Exchange for the Global Electronics Community

Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.

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Approaching FCT with Low-Cost Modular and Fully Integrated Test Fixtures

Constant increases in feature density of printed circuit board assemblies (PCBA) has highlighted the importance of functional circuit test (FCT) systems in a manufacturing process. Automated .. read more

The Next RF Probing Challenge: IoT and 5G

IoT and 5G applications have theirchallenges when it comes to functional testing –especially for the probing part inside a functional test fixture(hereinafter referred to as “FCT” fixture).I .. read more

Next Generation Test Methodologies and Analysis for Physical Layer Structures

Printed circuit board (PCB) material properties and surface roughness directly influence attenuation and NEXT/FEXT crosstalk signal integrity of high speed digital interconnect design. Balancin .. read more

Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards to a Real-Life Product

Design for test rules (DFT) for in circuit test (ICT) test pads are well known and have served the industry well for nearly two decades. However,increasing PCB densities continually put pressur .. read more

Approaching FCT with Low-Cost Modular and Fully Integrated Test Fixtures

Constant increases in feature density of printed circuit board assemblies (PCBA) has highlighted the importance of functional circuit test (FCT) systems in a manufacturing process. Automated .. read more

The Next RF Probing Challenge: IoT and 5G

IoT and 5G applications have theirchallenges when it comes to functional testing –especially for the probing part inside a functional test fixture(hereinafter referred to as “FCT” fixture).I .. read more

Next Generation Test Methodologies and Analysis for Physical Layer Structures

Printed circuit board (PCB) material properties and surface roughness directly influence attenuation and NEXT/FEXT crosstalk signal integrity of high speed digital interconnect design. Balancin .. read more

Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards to a Real-Life Product

Design for test rules (DFT) for in circuit test (ICT) test pads are well known and have served the industry well for nearly two decades. However,increasing PCB densities continually put pressur .. read more