Knowledge Hub
Your Gateway to Technical Knowledge Exchange for the Global Electronics Community
Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
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Early Defect Detection with a Scalable Broad-Spectrum Test Using Radiofrequency Reflectometry
This work explores radio frequency (RF) reflectometry as an early-stage defect detection technology for electronics. In-circuit testing (ICT) is limited to fully assembled boards, while auto
.. read more
Early Defect Detection with a Scalable Broad-Spectrum Test Using Radiofrequency Reflectometry
This work explores radio frequency (RF) reflectometry as an early-stage defect detection technology for electronics. In-circuit testing (ICT) is limited to fully assembled boards, while auto
.. read more