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THE EFFECT OF FILLING VIA-IN-PAD ON VOIDING RATES IN PWB ASSEMBLY FOR BGA COMPONENTS
The debate on the effect of voiding on BGA reliability has continued for years. Many PWB assemblers strive to minimize voiding,particularly with the advent of lead-free processing and in fine f
.. read more
Characterization of PCB Plated-Thru-Hole Reliability using Statistical Analysis
Various test methods are used to characterize the PCB plated-thru-hole reliability. One such method is the Interconnect Stress
Test (IST). The results from this test are often used to qualify P
.. read more
HDPUG's Reliability Testing and Data Analysis of High-Density Packages Lead-Free Solder Joints
Temperature cycling test and statistical analysis of various high-density packages on PCBs with SnCu HASL,NiAu,
and OSP finishes are investigated in this study. Emphasis is placed on the determ
.. read more
THE EFFECT OF FILLING VIA-IN-PAD ON VOIDING RATES IN PWB ASSEMBLY FOR BGA COMPONENTS
The debate on the effect of voiding on BGA reliability has continued for years. Many PWB assemblers strive to minimize voiding,particularly with the advent of lead-free processing and in fine f
.. read more
Characterization of PCB Plated-Thru-Hole Reliability using Statistical Analysis
Various test methods are used to characterize the PCB plated-thru-hole reliability. One such method is the Interconnect Stress
Test (IST). The results from this test are often used to qualify P
.. read more
HDPUG's Reliability Testing and Data Analysis of High-Density Packages Lead-Free Solder Joints
Temperature cycling test and statistical analysis of various high-density packages on PCBs with SnCu HASL,NiAu,
and OSP finishes are investigated in this study. Emphasis is placed on the determ
.. read more