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Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
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Investigation of Pad Cratering in Large Flip-Chip BGA using Acoustic Emission
Electronics assemblies with large flip-chip BGA packages can be prone to either pad cratering or brittle intermetallic (IMC)
failures under excessive PCB bending. Pad cratering cracks are not d
.. read more
Dynamic Testing and Modeling for Solder Joint Reliability Evaluation
The behavior of BGA solder joints under dynamic loads has become more significant in recent years. This work explored test
methodologies for solder joint failure evaluation under dynamic loads.
.. read more
Investigation of Pad Cratering in Large Flip-Chip BGA using Acoustic Emission
Electronics assemblies with large flip-chip BGA packages can be prone to either pad cratering or brittle intermetallic (IMC)
failures under excessive PCB bending. Pad cratering cracks are not d
.. read more
Dynamic Testing and Modeling for Solder Joint Reliability Evaluation
The behavior of BGA solder joints under dynamic loads has become more significant in recent years. This work explored test
methodologies for solder joint failure evaluation under dynamic loads.
.. read more