Chairman/CTO 

Reliability Assessment Solutions, Inc.

Bob Neves is Chairman/CTO of Reliability Assessment Solutions Inc., the manufacturer of the HATS²™ Via Structure and Solder Joint Reliability and Robustness Tester. Neves founded Microtek Laboratories, an Independent Test Facility with offices in Jiangsu, China, and originally in California, USA. He served as President of IRTS, the manufacturer of the original HATS tester. 

He has served as IPC’s TAEC chairman, Rigid Board General Committee chairman, HDI General Committee chairman, Rigid Board Test Method Task Group chairman, IPC Task Group Asia Technical Liaison, Laboratory Qualifications Committee chairman, and has been involved in more than 50 IPC committees in the United States and Asia during his career. 

He also served as the chairman of the IEC TC52/91 Test Methods Committee and a member of the UL STP Standards committees associated with plastics, PCBs, and CCL. He holds patents for HATS²™ accelerated via reliability technology. In 2007, he was inducted into the IPC Hall of Fame, the IPC’s highest lifetime honor, and was awarded the Dieter Bergman IPC Fellowship Medal in 2015. Neves has served on the IPC Board of Directors since 2012.