QFN Flux Entrapment Case Study
The presentation will discuss the problems that many QFN users are dealing with by having flux trapped under the component that is still gooey and conductive and the effect on circuit performan
.. read more
Event
IPC Midwest 2012
Printing and Assembly Challenges for QFN Devices
QFN’s offer advantages in reducing size and weight and have excellent thermal and electrical Conductivity related to the ground plane. QFN’s also present printing and assembly challenges includ
.. read more
Event
IPC Midwest 2012
Pad Cratering
Lead-free assembly has introduced many challenges and non-conformances. One of the more troubling non-conformances is “Pad Cratering”. Pad cratering is when the copper pad completely separates
.. read more
Event
IPC Midwest 2012
Consideration for Selection and Implementation of Low VOC Conformal Coating into High Reliability Electronics Manufacturing Operation
The purpose of this presentation is to provide considerations for selection of conformal coatings into electronics assembly operations. The types of testing required for selection and use of co
.. read more
Event
IPC Midwest 2012
Multifunctional Nanocomposite Liquid-Repellent Coatings/Films for the Electronics Industry
Recent advances in polymer science and nanomaterials have fueled a frenzy of scientific activity in multifunctional coatings and films. This rich subject area encompasses several scientific dis
.. read more
Event
IPC Midwest 2012
Lead Free Die Attach Technology for High Power Applications
TLPS materials are an attractive alternative to PbSn for IC power device packaging. They provide a low VOC composition,lead free die attach solution that meets the RoHS guidelines. TLPS materia
.. read more
Event
IPC Midwest 2012
Capillary IC – A New Platform for High Throughput or High Resolution Separations of Ionic Compounds
There has been increasing interest in the development of capillary ion chromatography (IC) systems and methods for determination of ionic species. The practice of ion chromatography in capillar
.. read more
Event
IPC Midwest 2012
Moisture Diffusion in Electronic Packaging Materials
Moisture poses a significant threat to the reliability of microelectronic assemblies,especially for scientific research products that are designed for marine environment and can be attributed a
.. read more
Event
IPC Midwest 2012
Is the ENIG Process Evil,or is it Maybe QA,Engineer or Sales Guy?
The case of processing issues with Electroless Nickel/Immersion Gold (ENIG) is well documented,even as it endures as a very popular surface finish. Certainly the market says that quality ENIG h
.. read more
Event
IPC Midwest 2012
Jetting Solder Paste Opens Up New Possibilities in Your SMT Production
Jetting of liquids is becoming the standard in our industry. MYDATA has developed a unique tool to jet solder paste. This non-contact method of applying solder paste has a large number of advan
.. read more
Event
IPC Midwest 2012
NPI Step Stencils- A New Approach
There are a variety of stencil approaches in which the new product process engineer can deal with the assembly of both high solder paste and low solder paste volume in an SMT assembly environme
.. read more
Event
IPC Midwest 2012
Dual Solvent Electronic Assembly Cleaning
Electronic Assemblies are cleaned in order to remove contaminations that may affect yields,service life and reliability. Highly dense interconnects entrap flux residues under the Z-axis. Volati
.. read more
Event
IPC Midwest 2012
Reflow Soldering Equals Wave Soldering Plus One
Lead-free solder is more than a swap for SnPb and more than simply an alternative alloy. Five years after implementation discussion remains regarding which alloy is the best for which applicati
.. read more
Event
IPC Midwest 2012
The Effect of Powder Surface Area and Oxidation on the Voiding Performance of PoP Solder Pastes
With the miniaturization of components in the semiconductor industry,the need for specialized solder pastes with finer powder mesh sizes for package-on-package (PoP) assemblies has become imper
.. read more
Event
IPC Midwest 2012
New Developments in PCB Laminates
Executive Summary
There are many issues to consider when developing a new circuit material for the PCB industry. It is a given assumption that the new material must be compatible to standard PC
.. read more
Event
IPC Midwest 2012
Environmental Compliance Reporting – Mastering a Moving Target
Companies that have initiated internal resources to obtain compliance data have realized that collecting,and more importantly,maintaining the currency of that data requires more resources than
.. read more
Event
IPC APEX EXPO 2012
Scaling LCA with IPC-175x
- Live Cycle Assessment
- Early Product Analysis / “DFX” Challenge
- Keys to Scaling #1: Processes and Systems
- Systems can Extend “Traditional” LCA
- Keys to Scaling #2: Data Exchange Standar
.. read more
Event
IPC APEX EXPO 2012
An Investigation of Whisker Growth on Tin Coated Wire and Braid
Pure tin is a common finish for copper hook up wire,coaxial cable,ground braid and harness assemblies used on electronic assemblies. Historically there have been fewer reports of whisker growth
.. read more
Event
IPC APEX EXPO 2012
Elemental Compositions of Over Two Dozen Cell Phones
Twenty-nine different cells phones have been disassembled,ground up,dissolved and analyzed for elemental content,mainly for information about the metals present in the phones,but also for some
.. read more
Event
IPC APEX EXPO 2012
Growth Mechanisms of Tin Whiskers at Press-in Technology
Compliant press-fit zones apply external mechanical stress to copper and tin surfaces of plated through holes at printed circuit boards during and after performing the press-in process. This ex
.. read more
Event
IPC APEX EXPO 2012
Effects of Tin and Copper Nanotexturization on Tin Whisker Formation
The physical mechanisms behind tin whisker formation in pure tin (Sn) films continue to elude the microelectronics industry. Despite modest advances in whisker mitigation techniques (i.e.,barri
.. read more
Event
IPC APEX EXPO 2012
Integrated Electrical Test within the Production Line
Many companies use “one stop testing” as a solution to the test issues in a manufacturing environment rather than discrete
“islands of test”. Low volume,high mix electronic manufactures are con
.. read more
Event
IPC APEX EXPO 2012
Effective Test-Probe Assignment on PCB Electrical Testing
Test point optimization for the PCB electrical test domain brings the test speed faster for the flying probe tester (FPT),
and the fixture cost lower for the fixture type tester. The importance
.. read more
Event
IPC APEX EXPO 2012
Novel Probing Concepts for Mass-Production Tests: Design and Challenges
The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro mobility appli
.. read more
Event
IPC APEX EXPO 2012
Reduction of Voids in Solder Joints an Alternative to Vacuum Soldering
Voids in solder joints are representing one of the main problems especially for power electronics. A low and homogeneous
thermal resistance of solder joints is demanded for a quick and uniform
.. read more
Event
IPC APEX EXPO 2012
Thermal Cycle Reliability Study of Vapor Phase BGA Solder Joints
Prior to committing production boards to vapor phase soldering,we performed an evaluation to assess reliability and evaluate the vacuum soldering option. The reliability of vapor phase processe
.. read more
Event
IPC APEX EXPO 2012
Before & After Reflow Characterization of FCBGA Voiding Utilizing High Resolution CT Scan,X-ray (2D & 3D) Imaging,and Cross Section with Digital Imaging
A joint project between Flextronics Inc. and North Star Imaging Inc. is being conducted to correlate current x-ray imaging and cross-section analysis of BGA voiding with state of the art high r
.. read more
Event
IPC APEX EXPO 2012
A Time Dependent Analytical Analysis of Heat Transfer in A PCB during A Thermal Excursion
A great deal of work has already been done to determine the equilibrium temperature of a PCB when exposed to a heat source such as the thermal environment of reflow soldering. This study will g
.. read more
Event
IPC APEX EXPO 2012
A New Paradigm for Design through Manufacture
Working through the New Product Introduction (NPI) flow between the product design and manufacturing is usually a challenging process,with both parties being experts in their own fields and ine
.. read more
Event
IPC APEX EXPO 2012
Design and Construction Affects on PWB Reliability
The reliability,as tested by thermal cycling,of printed wire boards (PWB) are established by three variables; copper quality,material robustness and design. The copper quality was most influent
.. read more
Event
IPC APEX EXPO 2012
Stencil Printing of Small Apertures
Many of the latest SMT assemblies for hand held devices like cell phones present a challenge to process and manufacturing engineers with the introduction of miniature components such as .3 mm C
.. read more
Event
IPC APEX EXPO 2012
Solder Paste Deposits and the Precision of Aperture Sizes
Many articles have been published indicating that 60 to 75% of all board assembly problems stem from solder paste printing. The important outcome from the printing process is to get the correct
.. read more
Event
IPC APEX EXPO 2012
Stencil Printing Process Tools for Miniaturisation and High Yield Processing
The SMT print process is now very mature and well understood. However as consumers continually push for new electronic
products,with increased functionality and smaller form factor,the boundari
.. read more
Event
IPC APEX EXPO 2012
PCB Trace Impedance: Impact of Localized PCB Copper Density
Trace impedances are specified and controlled on PCBs as their nominal impedance value and variations are key factors in establishing
system I/O bus performance. PCB trace impedances are evalua
.. read more
Event
IPC APEX EXPO 2012
A Study of PCB Insertion Loss Variation in Manufacturing Using a New Low Cost Metrology
Signal integrity analysis has shown that printed circuit board (PCB) insertion loss is a key factor affecting high
speed channel performance. Determining and controlling PCB insertion loss have
.. read more
Event
IPC APEX EXPO 2012
TDI Imaging: An Efficient AOI and AXI Tool
As a result of heightened requirements for quality,integrity and reliability of electronic products,the role of wafer auditing
and nondestructive testing of printed circuit boards and electroni
.. read more
Event
IPC APEX EXPO 2012
Analysis of Optical Inspection from AOI and AVI machines
In PCB industry,Optical Inspection has been grown rapidly in past decades. It is now playing an important role in manufacturing process. Most manufacturers are now using AOI machines to report
.. read more
Event
IPC APEX EXPO 2012
Component Misplacement Prevention on the ICOS Tape & Reel process using TRIZ & Lean
The paper discusses on the problems faced by the Assembly,Test Manufacturing (ATM) plants of Intel Corporation for a certain Tape and Reel Process. The problem is generic across the other siste
.. read more
Event
IPC APEX EXPO 2012
Minimizing Voiding In QFN Packages Using Solder Preforms
According to Prismark Partners,the use of QFNs is growing faster than any package type except for flip-chip CSPs. Prismark
projects that by 2013,32.6 billion QFNs will be assembled worldwide,wh
.. read more
Event
IPC APEX EXPO 2012
Inclusion Voiding in Gull Wing Solder Joints
Solder voiding in ball grid array (BGA) solder joints has been well characterized and documented in IPC-A-610 and IPC-
7095 which define industry recommended BGA solder workmanship criteria and
.. read more
Event
IPC APEX EXPO 2012
Void Detection in Large Solder Joints of Integrated Power Electronics
• Inspection of integrated power electronics = sophisticated test task
• X-ray inspection based on 2D / 2.5D principles not utilisable
• Full 3D inspection with adapted image capturing and reco
.. read more
Event
IPC APEX EXPO 2012
Evaluation of Laminates in Pb-free HASL Process and Pb-free Assembly Environment
An evaluation of four FR4 laminates in commonly used stack-ups was done to determine their survivability for the Pb-free HASL process followed by a worst case Pb-free manufacturing environment
.. read more
Event
IPC APEX EXPO 2012
A Novel Material for High Layer Count and High Reliability Printed Circuit Boards
Over the past few years a new family of laminate systems has been developed to face the increasing physical demands of
withstanding Pb-free soldering processes used in the assembly of RoHS comp
.. read more
Event
IPC APEX EXPO 2012
Polyphenylene Ether Macromonomers. XI. Use in Non-Epoxy Printed Wiring Boards
The continuous progression toward portable,high frequency microelectronic systems has placed high demands on material
performance,notably low dielectric constants (Dk),low loss tangent (Df),low
.. read more
Event
IPC APEX EXPO 2012
The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish
In this paper,we report on a comprehensive study regarding the morphology evolution and voiding of SnAgCu solder joints
on the central pad of two different packages – QFN and an Agilent package
.. read more
Event
IPC APEX EXPO 2012
Effect of Cooling Rate on the Intermetallic Layer in Solder Joints
While it has long been known that the Cu6Sn5 intermetallic that plays a critical role in the reliability of solder joints made with tin-containing alloys on copper substrates exists in two diff
.. read more
Event
IPC APEX EXPO 2012
No-Clean Flux Residue and Underfill Compatibility Effects on Electrical Reliability
No-clean soldering processes dominate the commercial electronics manufacturing world. With the explosion of growth in handheld electronics devices,manufacturers have been forced to look for way
.. read more
Event
IPC APEX EXPO 2012
VOC-free Flux Study Not All WOA (Weak Organic Acids) Are the Same
In an effort to reduce volatile organic compound (VOC) emissions within our environment,policymakers
have encouraged and/or mandated that electronics manufacturers change from alcohol-based VOC
.. read more
Event
IPC APEX EXPO 2012
Application Of Build-in Self Test In Functional Test Of DSL
1. What is BIST
2. What is DSL
3. DSL test items
4. Digital & Analog DSL test
5. BIST on DSL
6. Comparison & Benefits
.. read more
Event
IPC APEX EXPO 2012
Boundary Scan Advanced Diagnostic Methods
Boundary-scan (1149.1) technology was originally developed to provide a far easier method to perform digital DC testing to detect intra-IC interconnect assembly faults,such as solder shorts and
.. read more
Event
IPC APEX EXPO 2012