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Device Miniaturization - The Impact of a High Density SoC Direct Chip Attach on Surface Mount and PCB Technologies

To keep up with shrinking system volume requirements for the Internet of Things and wearable devices while maintaining maximum device functionality requires an integrated approach to SoC and Si .. read more
Author(s)
Tim Swettlen,David Boggs,Juan Landeros,Dudi Amir,Scott Mokler
Event
IPC APEX EXPO 2015

Overview Miniaturization on Large Form factor PCBA

The world of electronics continues to increase functional densities on products. Many of the miniaturization technologies were developed for the consumer market with the smart phone specificall .. read more
Author(s)
David Geiger,Anwar Mohammed,Murad Kurwa
Event
IPC APEX EXPO 2015

An Alternative Solvent with Low Global Warming Potential

In the past 20 yrs the solvent industry has gone through a great deal of change. In the early 1990s,CFC-113 and 1,1,1-trichloroethane were the workhorses of the industry. The Montreal Protocol .. read more
Author(s)
R. Basu,R. Hulse
Event
IPC APEX EXPO 2014

HCFC-225 Phaseout—What Now?

On January 1,2015,nine months from APEX 2014,the production and use restrictions on HCFC-225 will be in effect throughout the United States. This phase out is encompassing in scope. This phase .. read more
Author(s)
Ed Kanegsberg
Event
IPC APEX EXPO 2014

Concentration Monitoring & Closed Loop Control – Phase 2

Historically,the determination of the concentration of cleaning agent in high precision electronic cleaning baths has depended on any one of several possible measurable parameters. Refractive I .. read more
Author(s)
Umut Tosun,Axel Vargas,Bryan Kim
Event
IPC APEX EXPO 2014

Combination of Spray and Soak Improves Cleaning under Bottom Terminations

The functional reliability of electronic circuits determines the overall reliability of the product in which the final products are used. Market forces including more functionality in smaller c .. read more
Author(s)
Mike Bixenman,Julie Fields,Eric Camden
Event
IPC APEX EXPO 2014

Method for the Manufacture of an Aluminum Substrate PCB and its Advantages

RoHS legislated restrictions on the materials used in electronics manufacture have imparted significant challenges on the electronics industry since their introduction in 2006. The greatest imp .. read more
Author(s)
Joseph Fjelstad
Event
IPC APEX EXPO 2014

Optimizing the Insulated Metal Substrate Application with Proper Material Selection and Circuit Fabrication

The ever expanding growth in the use of insulated metal substrates (IMS) in power electronics requires a focus on material and mechanical configuration for each application. By optimizing the m .. read more
Author(s)
Dave Sommervold,Chris Parker,Steve Taylor,Garry Wexler
Event
IPC APEX EXPO 2014

Advanced Thermal Management Solutions on PCBs for High Power Applications

With increasing power loss of electrical components,thermal performance of an assembled device becomes one of the most important quality factors in electronic packaging. Due to the rapid advanc .. read more
Author(s)
Gregor Langer,Markus Leitgeb,Johann Nicolics,Michael Unger,Hans Hoschopf,Franz P. Wenzl
Event
IPC APEX EXPO 2014

Print Performance Studies Comparing Electroform and Laser-Cut Stencils

There has been recent activity and interest in Laser-Cut Electroform blank foils as an alternative to normal Electroform stencils. The present study will investigate and compare the print perfo .. read more
Author(s)
Rachel Miller Short,William E. Coleman,Joseph Perault
Event
IPC APEX EXPO 2014

Quantifying Stencil Aperture Wall Quality

The goal of this study was to develop a method by which stencil aperture wall quality can be inspected,and the results quantified. Additionally,we hope to establish a correlation between the st .. read more
Author(s)
Christopher Tibbetts,Michael Antinori
Event
IPC APEX EXPO 2014

Development,Testing and Implementation of SAMP-Based Stencil Nano Coatings

Stencil nanocoatings have demonstrated significant improvements in numerous aspects of solder paste printing,including print yield,transfer efficiency,print definition and under wipe requiremen .. read more
Author(s)
Chrys Shea,Ray Whittier,Eric Hanson
Event
IPC APEX EXPO 2014

Numerical Study on New Pin Pull Test for Pad Cratering Of PCB

Pad cratering is an important failure mode besides crack of solder joint as it’ll pass the regular test but have impact on the long term reliability of the product. A new pin pull test method w .. read more
Author(s)
Billy Hu,Jesus Tan
Event
IPC APEX EXPO 2014

Pad Cratering Susceptibility Testing with Acoustic Emission

Pad cratering test methods have been under development with the emergence of this laminate fracture defect mechanism. In additional to ball shear,ball pull,and pin pull testing methods,the acou .. read more
Author(s)
Wong Boon San,Richard Nordstrom,Julie Silk
Event
IPC APEX EXPO 2014

Novel Approaches for Minimizing Pad Cratering

With the electronic industry moving towards lead-free assembly,traditional SnPb-compatible laminates need to be replaced with lead-free compatible laminates that can withstand the higher reflow .. read more
Author(s)
Chen Xu,Yuan Zeng,Pericles A. Kondos,Yunhu Lin
Event
IPC APEX EXPO 2014

Why Generic Automation will Change the Electronics Manufacturing Services Industry

As the Electronic Manufacturing Services (EMS) industry makes a push to bring manufacturing back to the United States it is clear that automation is necessary in order to keep prices competitiv .. read more
Author(s)
Tor Krog
Event
IPC APEX EXPO 2014

New Placement Technology for Rework Systems

In the fast developing electronic industry the demands for production equipment are changing rapidly as well. The industry is looking for both,stable production processes and automated procedur .. read more
Author(s)
Joerg Nolte
Event
IPC APEX EXPO 2014

A Robot’s Place in SMT

The SMT industry’s one constant is change. Standards are continually updated and components are miniaturized for space savings. In addition to the changes that come,the industry is also faced w .. read more
Author(s)
Scott Zerkle,Makoto Murakami
Event
IPC APEX EXPO 2014

Lead-Free Nanosolder Based Nanomaterials Assembly and Integration

Nanomaterials have shown great promise in various applications including nanoelectronics and devices. However,in order to achieve large-scale nanoelectronics assembly and manufacturing,the deve .. read more
Author(s)
Fan Gao,Zhiyong Gu,Sammy Shina
Event
IPC APEX EXPO 2014

Embedded Fibers Enhance Nano-Scale Interconnections

While the density of chip-to-chip and chip-to-package component interconnections increases and their size decreases the ease of manufacture and the interconnection reliability are being reduced .. read more
Author(s)
V. Desmarism,S. Shafiee,A. Saleem,A. Johansson,P. Marcoux
Event
IPC APEX EXPO 2014

NanoCopper Based Solder-free Electronic Assembly Material

The Advanced Technology Center of the Lockheed Martin Corporation has developed a nanotechnology enabled copper-based electrical interconnect material that can be processed around 200 °C. The r .. read more
Author(s)
A. A. Zinn,R. M. Stoltenberg,J. Beddow,J. Chang
Event
IPC APEX EXPO 2014

An Experimental Approach to Characterising CAF

The electrochemical short,Conductive Anodic Filamentation,that that can develop within a PCB can be difficult to diagnose and detect,and there are many material and process issues that can lead .. read more
Author(s)
Christopher Hunt,Ling Zou
Event
IPC APEX EXPO 2014

Printed Circuit Board Fabrication Processes and Their Effects on Fine Copper Barrel Cracks

The onset of copper barrel cracks is typically induced by the presence of manufacturing defects. In the absence of discernible manufacturing defects,the causes of copper barrel cracks in printe .. read more
Author(s)
Edward Arthur,Charles Busa,Melissa Durfeem,Chad Gibson,Wade Goldman
Event
IPC APEX EXPO 2014

An Examination of Glass-fiber and Epoxy Interface Degradation in Printed Circuit Boards

Conductive filament formation or CAF typically occurs in two steps: degradation of the resin/glass fiber bond followed by an electrochemical reaction. Bond degradation provides a path along whi .. read more
Author(s)
Bhanu Sood,Michael Osterman,Michael Pecht
Event
IPC APEX EXPO 2014

New Requirements for Sir- Measurement

During the last period of newly assembled electrical devices (pcbs),new component types like LGA and QFN were also qualified as well as smaller passive components with reliability requirements .. read more
Author(s)
Jörg Trodler,Mathias Nowottnick
Event
IPC APEX EXPO 2014

Reliability Assessment of No-clean and Water-soluble Solder Pastes Part II

Looking back twenty-five years ago,the solder pastes residues had to be cleaned after reflow due to their corrosive nature; two ways of cleaning were possible,either with solvent or by using wa .. read more
Author(s)
Emmanuelle Guéné
Event
IPC APEX EXPO 2014

Reliability Assessment of No-clean and Water-soluble Solder Pastes Part II

Looking back twenty-five years ago,the solder pastes residues had to be cleaned after reflow due to their corrosive nature; two ways of cleaning were possible,either with solvent or by using wa .. read more
Author(s)
Emmanuelle Guéné
Event
IPC APEX EXPO 2014

The Effect of Reflow Profiling on the Electrical Reliability of No-Clean Solder Paste Flux Residues

An estimated 80% of all SMT assembly in the world is performed with a no-clean soldering process,largely due to the predominance of consumer-type electronics. The continuing trend of increasing .. read more
Author(s)
Eric Bastow
Event
IPC APEX EXPO 2014

Low Cost High Reliability Assembly of POP with Novel Epoxy Flux on Solder Paste

A novel epoxy flux was developed with good compatibility with no-clean solder pastes,which imparts high reliability for BGA assembly at a low cost. This compatibility with solder pastes is achi .. read more
Author(s)
Ming Hu,Lee Kresge,Ning-Cheng Lee
Event
IPC APEX EXPO 2014

An Investigation into Printing Miniaturised Devices for the Automotive and Industrial Manufacturing Sectors

The electronics market is divided into many segments each having its own challenges; but one theme that connects the electronics community together is a need for higher yield with lower costs. .. read more
Author(s)
Clive Ashmore,Mark Whitmore
Event
IPC APEX EXPO 2014

Enclosed Media Printing as an Alternative to Metal Blades

Fine pitch/fine feature solder paste printing in PCB assembly has become increasingly difficult as board geometries have become ever more compact. The printing process itself,traditionally the .. read more
Author(s)
Michael L. Martel
Event
IPC APEX EXPO 2014

Cost Comparison of Complex PCB fabrication Using Traditional Sequential Lamination Methods versus Interconnect with Conductive Paste

As feature sizes are driven to be smaller,the cost of PCB fabrication is driven higher. In particular,sequential lamination of complex circuit boards is a time consuming and expensive process. .. read more
Author(s)
Chet A. Palesko,Amy J. Palesko,James Haley,Catherine Shearer
Event
IPC APEX EXPO 2014

Effect of Microwave Plasma Surface Treatement for Improved Adhesion Strength of Direct Copper Plating on Polterafluoroethylene (PTFE)

The purpose of this study is to investigate the effect of plasma surface modification to improve adhesion strength between polytetrafluoroethylene (PTFE) and directly plated electroless copper. .. read more
Author(s)
Akira Takeuchi,Takahiro Kurahashi,Kyosuke Takeda
Event
IPC APEX EXPO 2014

Harnessing Technology for the Warfighter

Mr. Craig Herndon & Mr. Roger Smith will be discussing the Navy’s assignment as the DoD Executive Agent for Printed Circuit Board (PrCB) Technology and its role in ensuring that viable military .. read more
Author(s)
Alan M. Pratt,Adam Razavian
Event
IPC APEX EXPO 2014

From Off-Shoring to On-Shoring to Regional Strategy

Since the late 1990s,the globalization of the electronics industry has put North American and European manufacturers in competition with manufacturers in China and other low-labor-cost areas. .. read more
Author(s)
Sharon Starr
Event
IPC APEX EXPO 2014

The Return to Regionalization for Electronics Manufacturing

One of the more notable trends in the data on electronics manufacturing over the past several years has been a return to regionalization. Defined as building in region for region,this trend is .. read more
Author(s)
Eric Miscoll
Event
IPC APEX EXPO 2014

Position Accuracy Machines for Selective Soldering Fine Pitch Components

The drive towards fine pitch technology also affects the soldering processes. Selective soldering is a reliable soldering process for THT (through hole) connectors and offers a wide process win .. read more
Author(s)
Gerjan Diepstraten
Event
IPC APEX EXPO 2014

Study of Various PCBA Surface Finishes

In this study various printed circuit board surface finishes were evaluated,including: organic solderability preservative (OSP),plasma finish (PF),immersion silver (IAg),electroless nickel / im .. read more
Author(s)
Georgie Thein,David Geiger,Murad Kurwa
Event
IPC APEX EXPO 2014

Reliability Screening of Lower Melting Point Pb-Free Alloys Containing Bi

This paper is the second of two papers discussing the companies Lower Melt Alloy program. The first paper was presented at IPC APEX2013. The program explores the manufacturability and reliabili .. read more
Author(s)
Polina Snugovsky,Eva Kosiba,Jeffrey Kennedy,Zohreh Bagheri,Subramaniam Suthakaran,Marianne Romansky
Event
IPC APEX EXPO 2014

Voiding and Drop Test Performance of Lead-Free Low Melting and Medium Melting Mixed Alloy BGA Assembly

Low melting 57Bi42Sn1Ag (BiSnAg) was explored for replacing SAC solders as a low-cost solution. In this study,BGAs with SAC105,SAC305,and BiSnAg balls were assembled with SAC105,SAC305 or 57Bi4 .. read more
Author(s)
Yan Liu,Joanna Keck,Erin Page,Ning-Cheng Lee
Event
IPC APEX EXPO 2014

HALT Testing of Backward Soldered BGAs on a Military Product

The move to lead free (Pb-free) electronics by the commercial industry has resulted in an increasing number of ball grid array components (BGAs) which are only available with Pb-free solder bal .. read more
Author(s)
B. Gumpert,B. Fox,L. Woody
Event
IPC APEX EXPO 2014

Sample Preparation for Mitigating Tin Whiskers in Alternative Lead-Free Alloys

As lead-free alloys shift into high reliability electronics,the issue of tin whisker growth remains a primary concern among those in the industry. Current research shows that there is no perfec .. read more
Author(s)
Karl F. Seelig
Event
IPC APEX EXPO 2014

Gold Stud Bump Flip Chip Bonding on Molded Interconnect Devices

A molded interconnect device (MID) is an injection molded thermoplastic substrate which incorporates a conductive circuit pattern and integrates both mechanical and electrical functions. The th .. read more
Author(s)
Dick Pang,Weifeng Liu,Anwar Mohammed,Elissa Mckay,Teresita Villavert,Murad Kurwa
Event
IPC APEX EXPO 2014

Packaging Technology and Design Challenge for Fine Pitch Micro-Bump Cu-Pillar and BOT (Direct Bond on Substrate-Trace) Using TCNCP (Thermal Compression with Non-Conductive Paste Underfill) Method

The companies writing this paper have jointly developed Copper (Cu) Pillar micro-bump and TCNCP(Thermal Compression with Non-Conductive Paste) technology over the last two+ years. The Cu Pillar .. read more
Author(s)
MJ (Myung-June) Lee,SungSoon Park,DongSu Ryu,MinJae Lee,Hank (Hajime) Saiki,Seiji Mori,Makoto Nagai
Event
IPC APEX EXPO 2014

Study on Solder Joint Reliability of Fine Pitch CSP

Nowadays,consumer electronic product is characterized with miniature,portable,light and high performance,especially for 3G mobile products. More and more fine pitch CSPs (0.4mm) come forth as t .. read more
Author(s)
Yong (Hill) Liang,Hank Mao,YongGang Yan,Jingdong (King) Lee
Event
IPC APEX EXPO 2014

Stereo Vision Based Automated Solder Ball Height Detection

Solder ball height inspection is essential to the detection of potential connectivity issues in semi-conductor units. Current ball height inspection tools such as laser profiling,fringe project .. read more
Author(s)
Jinjin Li,Bonnie L. Bennett,Lina J. Karam,Jeff S. Pettinato
Event
IPC APEX EXPO 2014

Implementing Robust Bead Probe Test Processes into Standard Pb-Free Assembly

Increasing system integration and component densities continue to significantly reduce the opportunity to access nets using standard test points. Over time the size of test points has been dras .. read more
Author(s)
John McMahon,Tom Blaszczyk,Peter Barber
Event
IPC APEX EXPO 2014

Boundary-Scan Project Phase 3:Investigation into Challenges of using .BSDL Files

The number one issue identified by the 2009 iNEMI Boundary-Scan survey was problems with obtaining correct and compliant boundary-scan description language (.bsdl) files from the semiconductor .. read more
Author(s)
Philip B. Geiger
Event
IPC APEX EXPO 2014

Boundary-Scan Project Phase 3: Investigation into Challenges of using .BSDL Files

The number one issue identified by the 2009 iNEMI Boundary-Scan survey was problems with obtaining correct and compliant boundary-scan description language (.bsdl) files from the semiconductor .. read more
Author(s)
Philip B. Geiger
Event
IPC APEX EXPO 2014