Welcome to a collection of conference technical papers, webinars, presentations and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to the Knowledge Hub Database is reserved for members.

QFN Flux Entrapment Case Study

The presentation will discuss the problems that many QFN users are dealing with by having flux trapped under the component that is still gooey and conductive and the effect on circuit performan .. read more
Author(s)
Terry Munson
Event
IPC Midwest 2012

Printing and Assembly Challenges for QFN Devices

QFN’s offer advantages in reducing size and weight and have excellent thermal and electrical Conductivity related to the ground plane. QFN’s also present printing and assembly challenges includ .. read more
Author(s)
William E. Coleman
Event
IPC Midwest 2012

Pad Cratering

Lead-free assembly has introduced many challenges and non-conformances. One of the more troubling non-conformances is “Pad Cratering”. Pad cratering is when the copper pad completely separates .. read more
Author(s)
Trey Adams
Event
IPC Midwest 2012

Consideration for Selection and Implementation of Low VOC Conformal Coating into High Reliability Electronics Manufacturing Operation

The purpose of this presentation is to provide considerations for selection of conformal coatings into electronics assembly operations. The types of testing required for selection and use of co .. read more
Author(s)
Douglas O. Pauls
Event
IPC Midwest 2012

Multifunctional Nanocomposite Liquid-Repellent Coatings/Films for the Electronics Industry

Recent advances in polymer science and nanomaterials have fueled a frenzy of scientific activity in multifunctional coatings and films. This rich subject area encompasses several scientific dis .. read more
Author(s)
Constantine M. Megaridis
Event
IPC Midwest 2012

Lead Free Die Attach Technology for High Power Applications

TLPS materials are an attractive alternative to PbSn for IC power device packaging. They provide a low VOC composition,lead free die attach solution that meets the RoHS guidelines. TLPS materia .. read more
Author(s)
Michael Matthews,Ken Holcomb,Jim Haley,Rick Weaver,ES Barber,Catherine Shearer
Event
IPC Midwest 2012

Capillary IC – A New Platform for High Throughput or High Resolution Separations of Ionic Compounds

There has been increasing interest in the development of capillary ion chromatography (IC) systems and methods for determination of ionic species. The practice of ion chromatography in capillar .. read more
Author(s)
Peter Bodsky
Event
IPC Midwest 2012

Moisture Diffusion in Electronic Packaging Materials

Moisture poses a significant threat to the reliability of microelectronic assemblies,especially for scientific research products that are designed for marine environment and can be attributed a .. read more
Author(s)
Junaid Shafaat
Event
IPC Midwest 2012

Is the ENIG Process Evil,or is it Maybe QA,Engineer or Sales Guy?

The case of processing issues with Electroless Nickel/Immersion Gold (ENIG) is well documented,even as it endures as a very popular surface finish. Certainly the market says that quality ENIG h .. read more
Author(s)
Chris Mahanna
Event
IPC Midwest 2012

Jetting Solder Paste Opens Up New Possibilities in Your SMT Production

Jetting of liquids is becoming the standard in our industry. MYDATA has developed a unique tool to jet solder paste. This non-contact method of applying solder paste has a large number of advan .. read more
Author(s)
Nico Coenen
Event
IPC Midwest 2012

NPI Step Stencils- A New Approach

There are a variety of stencil approaches in which the new product process engineer can deal with the assembly of both high solder paste and low solder paste volume in an SMT assembly environme .. read more
Author(s)
Jim French,Bob Wettermann
Event
IPC Midwest 2012

Dual Solvent Electronic Assembly Cleaning

Electronic Assemblies are cleaned in order to remove contaminations that may affect yields,service life and reliability. Highly dense interconnects entrap flux residues under the Z-axis. Volati .. read more
Author(s)
Mike Bixenman,Joe McChesney
Event
IPC Midwest 2012

Reflow Soldering Equals Wave Soldering Plus One

Lead-free solder is more than a swap for SnPb and more than simply an alternative alloy. Five years after implementation discussion remains regarding which alloy is the best for which applicati .. read more
Author(s)
Gerjan Diepstraten
Event
IPC Midwest 2012

The Effect of Powder Surface Area and Oxidation on the Voiding Performance of PoP Solder Pastes

With the miniaturization of components in the semiconductor industry,the need for specialized solder pastes with finer powder mesh sizes for package-on-package (PoP) assemblies has become imper .. read more
Author(s)
Mario Scalzo,Brandon Judd
Event
IPC Midwest 2012

New Developments in PCB Laminates

Executive Summary There are many issues to consider when developing a new circuit material for the PCB industry. It is a given assumption that the new material must be compatible to standard PC .. read more
Author(s)
John Coonrod,Dean Hattula
Event
IPC Midwest 2012

Environmental Compliance Reporting – Mastering a Moving Target

Companies that have initiated internal resources to obtain compliance data have realized that collecting,and more importantly,maintaining the currency of that data requires more resources than .. read more
Author(s)
Peter Robinson
Event
IPC APEX EXPO 2012

Scaling LCA with IPC-175x

- Live Cycle Assessment - Early Product Analysis / “DFX” Challenge - Keys to Scaling #1: Processes and Systems - Systems can Extend “Traditional” LCA - Keys to Scaling #2: Data Exchange Standar .. read more
Author(s)
Jørgen Vos
Event
IPC APEX EXPO 2012

An Investigation of Whisker Growth on Tin Coated Wire and Braid

Pure tin is a common finish for copper hook up wire,coaxial cable,ground braid and harness assemblies used on electronic assemblies. Historically there have been fewer reports of whisker growth .. read more
Author(s)
Dave Hillman,Tim Pearson,Thomas Lesniewski
Event
IPC APEX EXPO 2012

Elemental Compositions of Over Two Dozen Cell Phones

Twenty-nine different cells phones have been disassembled,ground up,dissolved and analyzed for elemental content,mainly for information about the metals present in the phones,but also for some .. read more
Author(s)
Bev Christian,Irina Romanova,Laura Turbini
Event
IPC APEX EXPO 2012

Growth Mechanisms of Tin Whiskers at Press-in Technology

Compliant press-fit zones apply external mechanical stress to copper and tin surfaces of plated through holes at printed circuit boards during and after performing the press-in process. This ex .. read more
Author(s)
Hans-Peter Tranitz,Sebastian Dunker
Event
IPC APEX EXPO 2012

Effects of Tin and Copper Nanotexturization on Tin Whisker Formation

The physical mechanisms behind tin whisker formation in pure tin (Sn) films continue to elude the microelectronics industry. Despite modest advances in whisker mitigation techniques (i.e.,barri .. read more
Author(s)
David M. Lee,Lesly A. Piñol
Event
IPC APEX EXPO 2012

Integrated Electrical Test within the Production Line

Many companies use “one stop testing” as a solution to the test issues in a manufacturing environment rather than discrete “islands of test”. Low volume,high mix electronic manufactures are con .. read more
Author(s)
Michael Smith
Event
IPC APEX EXPO 2012

Effective Test-Probe Assignment on PCB Electrical Testing

Test point optimization for the PCB electrical test domain brings the test speed faster for the flying probe tester (FPT), and the fixture cost lower for the fixture type tester. The importance .. read more
Author(s)
Takeo Negishi
Event
IPC APEX EXPO 2012

Novel Probing Concepts for Mass-Production Tests: Design and Challenges

The world of spring-loaded test probes and special probes for in-circuit and functional tests have grown tremendously over the past few years. Ever increasing demands for electro mobility appli .. read more
Author(s)
Matthias Zapatka,Otmar Fischer,Sven Nocher
Event
IPC APEX EXPO 2012

Reduction of Voids in Solder Joints an Alternative to Vacuum Soldering

Voids in solder joints are representing one of the main problems especially for power electronics. A low and homogeneous thermal resistance of solder joints is demanded for a quick and uniform .. read more
Author(s)
Rolf Diehm,Mathias Nowottnick,Uwe Pape
Event
IPC APEX EXPO 2012

Thermal Cycle Reliability Study of Vapor Phase BGA Solder Joints

Prior to committing production boards to vapor phase soldering,we performed an evaluation to assess reliability and evaluate the vacuum soldering option. The reliability of vapor phase processe .. read more
Author(s)
Ward Gatza,Tom Evans
Event
IPC APEX EXPO 2012

Before & After Reflow Characterization of FCBGA Voiding Utilizing High Resolution CT Scan,X-ray (2D & 3D) Imaging,and Cross Section with Digital Imaging

A joint project between Flextronics Inc. and North Star Imaging Inc. is being conducted to correlate current x-ray imaging and cross-section analysis of BGA voiding with state of the art high r .. read more
Author(s)
Gordon O’Hara,Matthew Vandiver,Jonathan Crilly,Nick Brinkhoff
Event
IPC APEX EXPO 2012

A Time Dependent Analytical Analysis of Heat Transfer in A PCB during A Thermal Excursion

A great deal of work has already been done to determine the equilibrium temperature of a PCB when exposed to a heat source such as the thermal environment of reflow soldering. This study will g .. read more
Author(s)
J. Lee Parker
Event
IPC APEX EXPO 2012

A New Paradigm for Design through Manufacture

Working through the New Product Introduction (NPI) flow between the product design and manufacturing is usually a challenging process,with both parties being experts in their own fields and ine .. read more
Author(s)
Michael Ford
Event
IPC APEX EXPO 2012

Design and Construction Affects on PWB Reliability

The reliability,as tested by thermal cycling,of printed wire boards (PWB) are established by three variables; copper quality,material robustness and design. The copper quality was most influent .. read more
Author(s)
Paul Reid
Event
IPC APEX EXPO 2012

Stencil Printing of Small Apertures

Many of the latest SMT assemblies for hand held devices like cell phones present a challenge to process and manufacturing engineers with the introduction of miniature components such as .3 mm C .. read more
Author(s)
William E. Coleman
Event
IPC APEX EXPO 2012

Solder Paste Deposits and the Precision of Aperture Sizes

Many articles have been published indicating that 60 to 75% of all board assembly problems stem from solder paste printing. The important outcome from the printing process is to get the correct .. read more
Author(s)
Ahne Oosterhof,Stephan Schmidt
Event
IPC APEX EXPO 2012

Stencil Printing Process Tools for Miniaturisation and High Yield Processing

The SMT print process is now very mature and well understood. However as consumers continually push for new electronic products,with increased functionality and smaller form factor,the boundari .. read more
Author(s)
Clive Ashmore,Mark Whitmore
Event
IPC APEX EXPO 2012

PCB Trace Impedance: Impact of Localized PCB Copper Density

Trace impedances are specified and controlled on PCBs as their nominal impedance value and variations are key factors in establishing system I/O bus performance. PCB trace impedances are evalua .. read more
Author(s)
Gary A. Brist,Jeff Krieger,Dan Willis
Event
IPC APEX EXPO 2012

A Study of PCB Insertion Loss Variation in Manufacturing Using a New Low Cost Metrology

Signal integrity analysis has shown that printed circuit board (PCB) insertion loss is a key factor affecting high speed channel performance. Determining and controlling PCB insertion loss have .. read more
Author(s)
Chu-tien Chia,Richard Kunze,David Boggs,Margaret Cromley
Event
IPC APEX EXPO 2012

TDI Imaging: An Efficient AOI and AXI Tool

As a result of heightened requirements for quality,integrity and reliability of electronic products,the role of wafer auditing and nondestructive testing of printed circuit boards and electroni .. read more
Author(s)
Yakov Bulayev
Event
IPC APEX EXPO 2012

Analysis of Optical Inspection from AOI and AVI machines

In PCB industry,Optical Inspection has been grown rapidly in past decades. It is now playing an important role in manufacturing process. Most manufacturers are now using AOI machines to report .. read more
Author(s)
Adams Yin
Event
IPC APEX EXPO 2012

Component Misplacement Prevention on the ICOS Tape & Reel process using TRIZ & Lean

The paper discusses on the problems faced by the Assembly,Test Manufacturing (ATM) plants of Intel Corporation for a certain Tape and Reel Process. The problem is generic across the other siste .. read more
Author(s)
Darin Moreira
Event
IPC APEX EXPO 2012

Minimizing Voiding In QFN Packages Using Solder Preforms

According to Prismark Partners,the use of QFNs is growing faster than any package type except for flip-chip CSPs. Prismark projects that by 2013,32.6 billion QFNs will be assembled worldwide,wh .. read more
Author(s)
Seth J. Homer,Ronald C. Lasky
Event
IPC APEX EXPO 2012

Inclusion Voiding in Gull Wing Solder Joints

Solder voiding in ball grid array (BGA) solder joints has been well characterized and documented in IPC-A-610 and IPC- 7095 which define industry recommended BGA solder workmanship criteria and .. read more
Author(s)
T.L. Lewis,C.O. Ndiaye,J.R. Wilcox
Event
IPC APEX EXPO 2012

Void Detection in Large Solder Joints of Integrated Power Electronics

• Inspection of integrated power electronics = sophisticated test task • X-ray inspection based on 2D / 2.5D principles not utilisable • Full 3D inspection with adapted image capturing and reco .. read more
Author(s)
Patrick Schuchardt
Event
IPC APEX EXPO 2012

Evaluation of Laminates in Pb-free HASL Process and Pb-free Assembly Environment

An evaluation of four FR4 laminates in commonly used stack-ups was done to determine their survivability for the Pb-free HASL process followed by a worst case Pb-free manufacturing environment .. read more
Author(s)
Khaw Mei Ming,Andrey Lee
Event
IPC APEX EXPO 2012

A Novel Material for High Layer Count and High Reliability Printed Circuit Boards

Over the past few years a new family of laminate systems has been developed to face the increasing physical demands of withstanding Pb-free soldering processes used in the assembly of RoHS comp .. read more
Author(s)
Jie Wan,Junqi Tang,Xianping Zeng
Event
IPC APEX EXPO 2012

Polyphenylene Ether Macromonomers. XI. Use in Non-Epoxy Printed Wiring Boards

The continuous progression toward portable,high frequency microelectronic systems has placed high demands on material performance,notably low dielectric constants (Dk),low loss tangent (Df),low .. read more
Author(s)
Edward N. Peters,Scott M. Fisher,Hua Guo
Event
IPC APEX EXPO 2012

The Morphology Evolution and Voiding of Solder Joints on QFN Central Pads with a Ni/Au Finish

In this paper,we report on a comprehensive study regarding the morphology evolution and voiding of SnAgCu solder joints on the central pad of two different packages – QFN and an Agilent package .. read more
Author(s)
Julie Silk,Jianbiao Pan,Mike Powers
Event
IPC APEX EXPO 2012

Effect of Cooling Rate on the Intermetallic Layer in Solder Joints

While it has long been known that the Cu6Sn5 intermetallic that plays a critical role in the reliability of solder joints made with tin-containing alloys on copper substrates exists in two diff .. read more
Author(s)
Keith Sweatman,Tetsuro Nishimura,Stuart D. McDonald,Kazuhiro Nogita
Event
IPC APEX EXPO 2012

No-Clean Flux Residue and Underfill Compatibility Effects on Electrical Reliability

No-clean soldering processes dominate the commercial electronics manufacturing world. With the explosion of growth in handheld electronics devices,manufacturers have been forced to look for way .. read more
Author(s)
Eric Bastow
Event
IPC APEX EXPO 2012

VOC-free Flux Study Not All WOA (Weak Organic Acids) Are the Same

In an effort to reduce volatile organic compound (VOC) emissions within our environment,policymakers have encouraged and/or mandated that electronics manufacturers change from alcohol-based VOC .. read more
Author(s)
Karl F. Seelig
Event
IPC APEX EXPO 2012

Application Of Build-in Self Test In Functional Test Of DSL

1. What is BIST 2. What is DSL 3. DSL test items 4. Digital & Analog DSL test 5. BIST on DSL 6. Comparison & Benefits .. read more
Author(s)
YaJun Gu,Ye Qin,ZhiJun Wang,David Wei,Andrew Ho,Stephen Chen,Zhen (Jane) Feng,Murad Kurwa
Event
IPC APEX EXPO 2012

Boundary Scan Advanced Diagnostic Methods

Boundary-scan (1149.1) technology was originally developed to provide a far easier method to perform digital DC testing to detect intra-IC interconnect assembly faults,such as solder shorts and .. read more
Author(s)
Christopher Cain
Event
IPC APEX EXPO 2012