Knowledge Hub

Your Gateway to Technical Knowledge Exchange for the Global Electronics Community

Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.

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Reducing Defects with Embedded Sensing Technology

Typical SMT production lines are a collection of disconnected machines performing various tasks. Errors can occur at any step during this process,but often go undetected until the PWB is comple .. read more

Collaborative Cleaning Process Innovations from Managing Experience and Learning Curves

Moore’s Law infers that the number of transistors on a chip doubles approximately every two years. Consistent with Moore’s Law,high reliability electronic devices build faster processing speed .. read more

What’s Process Control Good For? Real Data from Real Sites

This paper presents data collected from a set of electronics manufacturers using an automated optical inspection post-place system for the purpose of both defect detection and process-control a .. read more

Automated Optical Inspection (AOI) - A Yield Management Solution for the High Density Interconnection (HDI) - Flexible Circuit Industry

The information age has arrived. A growing percentage of the Earth’s population now has access to pagers,cellular phones,computers,personal digital assistants (PDA’s),and a host of other electr .. read more

Reducing Defects with Embedded Sensing Technology

Typical SMT production lines are a collection of disconnected machines performing various tasks. Errors can occur at any step during this process,but often go undetected until the PWB is comple .. read more

Collaborative Cleaning Process Innovations from Managing Experience and Learning Curves

Moore’s Law infers that the number of transistors on a chip doubles approximately every two years. Consistent with Moore’s Law,high reliability electronic devices build faster processing speed .. read more

What’s Process Control Good For? Real Data from Real Sites

This paper presents data collected from a set of electronics manufacturers using an automated optical inspection post-place system for the purpose of both defect detection and process-control a .. read more

Automated Optical Inspection (AOI) - A Yield Management Solution for the High Density Interconnection (HDI) - Flexible Circuit Industry

The information age has arrived. A growing percentage of the Earth’s population now has access to pagers,cellular phones,computers,personal digital assistants (PDA’s),and a host of other electr .. read more