Knowledge Hub

Your Gateway to Technical Knowledge Exchange for the Global Electronics Community

Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.

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A Study of PCB Insertion Loss Variation in Manufacturing Using a New Low Cost Metrology

Signal integrity analysis has shown that printed circuit board (PCB) insertion loss is a key factor affecting high speed channel performance. Determining and controlling PCB insertion loss have .. read more

Low Cost Energy Based TDR Loss Method for PWB Manufacturers

While silicon density doubles approximately every 18 months,following Moore’s law,PWB electrical technology advances much more slowly,Up until now trace impedance has been a sufficient high spe .. read more

Propagation Delay Measurements with TDR in the Manufacturing Environment

This paper addresses the growing need in the Printed Wiring Board industry to measure and test propagation delay parameters of board interconnects within the fabrication process. The state of c .. read more

A Study of PCB Insertion Loss Variation in Manufacturing Using a New Low Cost Metrology

Signal integrity analysis has shown that printed circuit board (PCB) insertion loss is a key factor affecting high speed channel performance. Determining and controlling PCB insertion loss have .. read more

Low Cost Energy Based TDR Loss Method for PWB Manufacturers

While silicon density doubles approximately every 18 months,following Moore’s law,PWB electrical technology advances much more slowly,Up until now trace impedance has been a sufficient high spe .. read more

Propagation Delay Measurements with TDR in the Manufacturing Environment

This paper addresses the growing need in the Printed Wiring Board industry to measure and test propagation delay parameters of board interconnects within the fabrication process. The state of c .. read more