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Double Reflow-Induced Interfacial Failures in Pb-free Ball Grid Array Solder Joints

Assembly defects can effectively shorten reliability lifetimes in addition to lowering manufacturing yields or creating premature service failures. This paper describes and characterizes an unu .. read more
Author(s)
George Wenger,Richard Coyle,Jon Goodbread,Andrew Giamis
Event
IPC APEX EXPO 2013

Rework and Reliability of High I/O Column Grid Array Assemblies

Commercial-off-the-shelf column grid array packaging (COTS CGA) technologies in high reliability versions are now being considered for use in a number of National Aeronautics and Space Administ .. read more
Author(s)
Reza Ghaffarian
Event
IPC APEX EXPO 2013

Advanced Rework Technology and Processes for Next Generation Large Area Arrays,01005,PoP and QFN Devices

BGA Rework is now largely mature,although new supplemental processes that provide improved process control such as Solder Paste Dipping and Non-Contact Site Cleaning can now be integrated into .. read more
Author(s)
Brian Czaplicki
Event
IPC APEX EXPO 2013

EOS Exposure of Components in Soldering Process

This paper examines the nature; the consequences and the mitigation of electrical overstress (EOS) caused by electromagnetic interference (EMI),or electrical noise,on power lines and ground in .. read more
Author(s)
Vladimir Kraz
Event
IPC APEX EXPO 2013

Cleaning Of Assembled PCBs A Crucial Way of Enhancing Product Reliability and Avoiding Problems in the Field

Over the last years more and more International newspapers reported in Europe / USA and Japan: “Tunnel train got stuck under the Channel – thousands of people stranded “Recall of thousands of c .. read more
Author(s)
Wilfried Clemens
Event
IPC APEX EXPO 2013

High Reliability and Low Variability Results with Benchtop PCB Cleaning

The purpose of this study is to determine whether or not aerosol benchtop cleaning can consistently and reliably clean reworked boards. Different variables that play a role in the effectiveness .. read more
Author(s)
Lindsey Shehan
Event
IPC APEX EXPO 2013

In Situ Recycling of Cleaning and Rinsing Fluids to Meet Lean & Green Cleaning Process Targets

Recycling cleaning and rinsing fluids in the manufacturing process is becoming very popular for many reasons. Competitiveness is the key issue as the electronics industry ages. In our golden ye .. read more
Author(s)
Steve Stach
Event
IPC APEX EXPO 2013

Predicting the Lifetime of the PCB - From Experiment to Simulation

Two major drivers in electronic industry are electrical and mechanical miniaturization. Both induce major changes in the material selection as well as in the design. Nevertheless,the mechanical .. read more
Author(s)
Markus Leitgeb,Peter Fuchs
Event
IPC APEX EXPO 2013

Assembly Process Feasibility of Low/No Silver Alloy Solder Paste Materials

Sn3.0Ag0.5Cu (SAC305) is the most popular near eutectic lead-free alloy used in the manufacturing processes. Over the last several years,the price of silver has dramatically increased driving a .. read more
Author(s)
Jennifer Nguyen,Ranilo Aranda,David Geiger,Murad Kurwa
Event
IPC APEX EXPO 2013

Manufacturability and Reliability Screening of Lower Melting Point Pb-Free Alloys Containing Bi

This paper is the first of two papers discussing the Celestica/Honeywell Lower Melt Alloy program. The program explores the manufacturability and reliability for Pb-freethree Bi-containing allo .. read more
Author(s)
Polina Snugovsky,Eva Kosiba,Jeffrey Kennedy,Zohreh Bagheri,Marianne Romansky,Michael Robinson,Joseph M. Juarez Jr.,Joel Heebink
Event
IPC APEX EXPO 2013

Taking the LED Pick and Place Challenge

For the past few years there has been a shift in the Lighting Industry that has carried over to the surface mount technology assembly line. What is this shift you may ask? Well it is the LED re .. read more
Author(s)
Joshua J. Markle
Event
IPC APEX EXPO 2013

MICROSYSTEMS ENABLED PV

Microsystems Enabled PV: •Technology benefits •Process flow/assembly examples •Cost analysis •From R&D to commercialization •3DIC/hybrid assembly and new functionality .. read more
Author(s)
Murat Okandan,Jim Adriance
Event
IPC APEX EXPO 2013

Low Temperature Alloy Development for Electronics Assembly

New Low Temp. Alloys were developed,through elemental additions,to improve mechanical strength,fatigue life and drop shock resistance. •Effect of these elemental additions on the new alloys was .. read more
Author(s)
Ribas Morgana,Chegudi Sujatha,Kumar Anil,Pandher Ranjit,Mukherjee Sutapa,Sarkar Siuli,Raut Rahul,Singh Bawa
Event
IPC APEX EXPO 2013

PCB Surface Finishes for Low Temperature Solder Processing

Low temp solders are a viable solution and their performance can be enhance thought final finish selection. Initial data suggest that an organic metal final finish in combination with a low tem .. read more
Author(s)
Joseph Renda
Event
IPC APEX EXPO 2013

Low Temperature SMT Process Implementation

Low Temperature Conversion •Substantial cost savings over regular processes •Savings can outweigh paste cost differences •Can be mechanically stronger if done right •Involves more than just cha .. read more
Author(s)
Mitch Holtzer
Event
IPC APEX EXPO 2013

Jet Printing of Low Temperature Solder Paste

•Jet printing introduction •Industry challenges •Jet printing low temperature paste –Collaboration Alpha-MYDATA –Rheology –Results •Low temperature paste offers a production solution for advanc .. read more
Author(s)
Gustaf Mårtensson
Event
IPC APEX EXPO 2013

Effect of BGA Reballing and its Influence on Ball Shear Strength

As more components are becoming lead free and not available in the tin lead alloy,there is an industry wide interest when it comes to the reballing and the subsequent effects it has on the stre .. read more
Author(s)
S. Manian Ramkumar,Andrew J. Daya,Daniel B. Lewanda,Scott Rushia
Event
IPC APEX EXPO 2013

Automating the Rework Process: Technology Advancement Replaces Manual Method

Automated Optical Rework (AOR) is a new method of reworking shorts by using a fully automated fine laser beam to ablate any excess copper in fine-line PCB patterns. This includes shorts,protrus .. read more
Author(s)
Bert Kelley
Event
IPC APEX EXPO 2013

Advanced Through-Hole Rework of Thermally Challenging Components/Assemblies: An Evolutionary Process

Although the vast majority of electronic equipment has made the transition to lead-free without significant issue,some market segments still utilize tin-lead solder. The European Union’s RoHS l .. read more
Author(s)
Brian Czaplicki
Event
IPC APEX EXPO 2013

The Evolution of ICT: PCB Technologies,Test Philosophies,and Manufacturing Business Models Are Driving In-Circuit Test Evolution and Innovations

Many manufacturers employ one or more In-Circuit Test (ICT) systems in their PCB manufacturing facilities to help them detect manufacturing process and component defects. These “bed-of-nails” e .. read more
Author(s)
Alan J. Albee
Event
IPC APEX EXPO 2013

Improving Product Reliability through HALT and HASS Testing of Electronics and PCB’s

HALT & HASS technology uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages (often at board level),improving product reliability and c .. read more
Author(s)
Mark R. Chrusciel
Event
IPC APEX EXPO 2013

Mechanical Reliability – A New Method to Forecast Drop Shock Performance

In light of the recent technological trends within PCB manufacturing industry,there is an increasing degree of interest in understanding the influence factors of mechanical stress on the durabi .. read more
Author(s)
Ronald Frosch,Guenther Mayr,Manfred Riedler
Event
IPC APEX EXPO 2013

Evaluation and Characterization of Molded flip-chip BGA Package for 28nm FPGA Applications

As the FPGA device technology migrates to 28nm technology node and high performance applications,selecting the right package to meet the customer usability requirements and to achieve product r .. read more
Author(s)
Ganesh Sure,MJ Lee,Sam Lau,Miguel Jimarez,Corey Reichman,Jesse Galloway,Sasanka Kanuparthi,Jae Yun Kim,Joon Dong Kim,Robert Darveaux
Event
IPC APEX EXPO 2013

Material Selection and Parameter Optimization for Reliable TMV Pop Assembly

The successful integration of package-on-package (PoP) stacking utilizing through mold via (TMV) technology hinges on a robust assembly process. In this study,seven dip materials were investiga .. read more
Author(s)
Brian Roggeman,David Vicari,Lee Smith,Ahmer Syed
Event
IPC APEX EXPO 2013

Failure Modes in Wire bonded and Flip Chip Packages

The growth of portable and wireless products is driving the miniaturization of packages resulting in the development of many types of thin form factor packages and cost effective assembly proce .. read more
Author(s)
Mumtaz Y. Bora
Event
IPC APEX EXPO 2013

JEITA’s Standardization Activity of 2nd Generation Lead-Free Solder Paste

1.Obtain suggestions from the solder manufactures Low-Ag SAC Paste •Increase in reflow temp •Impact on thermal fatigue and wetting Sn-Bi low-temp Paste •Impact on shock strength •Creep fatigue .. read more
Author(s)
Koji Serizawa
Event
IPC APEX EXPO 2013

Influence of Microstructure on Mechanical Behavior of Bi-Containing Pb-Free Solders

SAC-Bi and Sn-Ag-Bi alloys have demonstrated superior performance in thermal cycling reliability tests of printed circuit boards,such as the National Center for Manufacturing Sciences programs .. read more
Author(s)
David B. Witkin
Event
IPC APEX EXPO 2013

Grain Refinement for Improved Lead-Free Solder Joint Reliability

The very small solder joints that now account for an increasing proportion of the connections on which modern electronics depends are typically made up of only a few grains,sometimes only a sin .. read more
Author(s)
K. Sweatman,S. D. McDonald,M. Whitewick,T. Nishimura,K. Nogita
Event
IPC APEX EXPO 2013

Conformal Coating over No Clean Flux

As the proliferation of modern day electronics continues to drive miniaturization and functionality,electronic designers/assemblers face the issue of environmental exposure and uncommon applica .. read more
Author(s)
Karl Seelig,Timothy O'Neill
Event
IPC APEX EXPO 2013

Reliability Assessment of No-clean and Water-soluble Solder Pastes Part I

Looking back twenty-five years ago,the solder pastes residues had to be cleaned after reflow due to their corrosive nature: two ways of cleaning were possible,either with solvent or by using wa .. read more
Author(s)
Emmanuelle Guéné,Steven Teh
Event
IPC APEX EXPO 2013

Liquid Flux Selection and Process Optimization for Selective Soldering Applications

There has been a rapid increase in the use of selective soldering equipment for PCB assembly –Lower equipment costs –Smaller equipment footprint –Lower solder “inventory” cost (smaller pots) –D .. read more
Author(s)
Mike Murphy,Russel Maynard,Laxminarayana Pai,Corné Hoppenbrouwers,Ansuman Das,Anubhav Rustogi
Event
IPC APEX EXPO 2013

Halogen Free Solder Paste

•What is a halogen? •Impact on the environment •Halides and halogens •Halides in electronics •Halogens in electronics •Definition of halogen free •Technical challenges to remove halogen •Curren .. read more
Author(s)
Gavin J. Jackson,Ian J. Wilding,Mark Currie
Event
IPC APEX EXPO 2013

Lead-free Nanosolders and Nanowire Joining for Microelectronics/Nanoelectronics Assembly and Packaging

- Nanosolder on multi-segment nanowires have been successfully fabricated by electrodeposition method; - Flux assisted environment enhanced reflow result and micron scale solder spheroids forme .. read more
Author(s)
Fan Gao,Zhiyong Gu,Sammy Shina
Event
IPC APEX EXPO 2013

Voiding: Contrary Effects of Voiding

#NAME? .. read more
Author(s)
Hans Bell,Helmut Öttl,Heinz Wohlrabe
Event
IPC APEX EXPO 2013

The Last Will and Testaments of Tin/Lead and Lead-free BGA Voids

Conclusions: •Tin/Lead BGAs: The location of the void within the solder joint was the primary root cause for the loss of solder joint integrity. •Lead-free BGAs: The statistical analysis and th .. read more
Author(s)
Dave Hillman,Dave Adams,Tim Pearson,Ross Wilcoxon,John Travis,David Bernard,Evstatin Krastev,Vineeth Bastin,Mario Scalzo,Bev Christian,Brandon Smith
Event
IPC APEX EXPO 2013

Voiding Mechanism and Control in Mixed Solder Alloy System

•Transition to Pb-free soldering is incomplete for high reliability or high temperature applications •For those not fully converted into Pb-free,mixed system is common due to lack of some Pb-co .. read more
Author(s)
Yan Liu,Derrick Herron,Joanna Keck,Ning-Cheng Lee
Event
IPC APEX EXPO 2013

Method to Measure Intermetallic Layer Thickness and Its Application to Develop a New Equation to Predict Its Growth

Lead Free Technology has brought new materials and different quality concerns to the Electronics Industry. For that,the creation of new methods to determine the quality of materials is needed a .. read more
Author(s)
Jose Servin
Event
IPC APEX EXPO 2013

Assembly Materials for High Temperature Application

Based on the trend for new technology in the automotive market including high power modules for e-mobility,and a combination of logic and power which will be developed for the future market wit .. read more
Author(s)
Jörg Trodler
Event
IPC APEX EXPO 2013

Reliability of Lead-Free LGAs and BGAs: Effects of Solder Joint Size,Cyclic Strain and Microstructure

An accelerated thermal cycle experiment comparing similarly constructed area array devices representing Land Grid Array (LGA) and Ball Grid Array (BGA) technology with 0.254,0.30,and 0.40mm dia .. read more
Author(s)
Denis Barbini,Michael Meilunas
Event
IPC APEX EXPO 2013

Quantitative Analysis of Corrosion Resistance for Electroless Ni-P Plating

An electroless nickel (EN) layer is frequently used in various industrial applications. Commonly it is used as the barrier layer in electroless nickel/immersion gold (ENIG) as a solderability p .. read more
Author(s)
Lei Jin,Jun Nable,Kesheng Feng,Lenora Toscano,Ernie Long
Event
IPC APEX EXPO 2013

Simulation of Embedded Components in PCB Environment and Verification of Board Reliability

Embedded components technology has launched its implementation in volume products demanding for highest miniaturization level. Small modules with embedded dies and passive components on the top .. read more
Author(s)
Johannes Stahr,M. Morianz,M. Brizoux,A. Grivon,W. Maia
Event
IPC APEX EXPO 2013

Embedded Passive Technology

Embedded Passive Technology is a viable technology that has been reliably used in the defense and aerospace industry for over 20 years. Embedded Passive (Resistors and Capacitors) Technology ha .. read more
Author(s)
Hikmat Chammas
Event
IPC APEX EXPO 2013

Warpage Optimization of Printed Circuit Boards with Embedded Active and Passive Components

Importance of the properties during curing: - Curing analysis has to be carried in a PCB level to improve understanding warpage mechanism. Specially it is very important in a laminating process .. read more
Author(s)
Seunghyun Cho,Ryan Park,Norbert Galster,Juergen Kress
Event
IPC APEX EXPO 2013

Insertion Loss Comparisons of Common High Frequency PCB Constructions

Printed Circuit Boards (PCB’s) have been used for many years in low loss,high frequency microwave applications and many of these circuits have become increasingly complex. Often these complex c .. read more
Author(s)
John Coonrod
Event
IPC APEX EXPO 2013

Influence of Via Stub Length and Antipad Size on the Insertion Loss Profile

The growing transmission speed and volume of digital content increases the pressure on reduction of overall insertion loss of printed circuit boards permanently. In today’s circuit boards,it is .. read more
Author(s)
Alexander Ippich
Event
IPC APEX EXPO 2013

Embedded System Access - a Paradigm Shift in Electrical Test

Throughout a product’s life cycle it may need to be tested various times. New product designs need to be validated during the prototyping phase,manufacturing defects need to be detected and dia .. read more
Author(s)
Heiko Ehrenberg,Thomas Wenzel
Event
IPC APEX EXPO 2013

Why Signal Always Be Loss in a High Speed Frequency Transmission Line

The high speed transmission applications in the electronic product become inevitable developing trend. The signal integrity becomes the most important issue in the electronic industry. The mate .. read more
Author(s)
Albert Chen
Event
IPC APEX EXPO 2013

Advanced Second Level Assembly Analysis Techniques - Troubleshooting Head-In-Pillow,Opens,and Shorts with Dual Full-Field 3D Surface Warpage Data Sets

SMT assembly planning and failure analysis of surface mount assembly defects often include component warpage evaluation. Coplanarity values of Integrated Circuit packages have traditionally bee .. read more
Author(s)
Ken Chiavone
Event
IPC APEX EXPO 2013

Head in Pillow X-ray Inspection at Flextronics

Manufacturing technology faces challenges with new packages/process when confronting the need for high yields. Identifying product defects associated with the manufacturing process is a critica .. read more
Author(s)
Alejandro Castellanos,Adalberto Gutierrez,Gilberto Martin,Matthew Vandiver,Ranga Dematampitiya,Hung Le,Elliott Le,Phuong Chau,Hao Cui,An Qi Zhao,Wei Bing Qian,Fuqing Li,Jacky Yao,Jiyang Zhang,Leonard Brisan,Cristian Gurka,Shane Young,Johann Bruenner,Martin Novak,Nadarajan M Singaram,Zhen (Jane) Feng,David Geiger,Murad Kurwa
Event
IPC APEX EXPO 2013

Online Databse of Materials for Printed Electronics

Materials Registry for Printed Electronics - WMU’s CAPE received an award from FlexTech Alliance to create an online database for accessing technical information on functional materials used in .. read more
Author(s)
Margaret K. Joyce,Erika Rebrosova,Massood Z. Atashbar,Marian Rebros
Event
IPC APEX EXPO 2013