Knowledge Hub
Your Gateway to Technical Knowledge Exchange for the Global Electronics Community
Explore our database of industry knowledge that fuels innovation, learning, and professional growth. Knowledge Hub is a collection of conference technical papers, webinars, presentations, on-demand video and more. You can search by author, title, keyword and type of content. You can also search for keywords and topics in the Tag field. Access to Knowledge Hub is reserved for members.
Qualification of Solder Beading and Tombstoning in Passive Devices using Designed Experiments
Solder beading and tombstoning are observed increasingly with chip components as their size decreases. This is
even more crucial in today’s packaging,due to the high ratio of passive components
.. read more
A Materials Based Solution for the Elimination of Tombstones
The drive for electronic devices to become lightweight,more portable,and posses increased functionality has driven
electronic components to smaller and smaller sizes. This decease in size does
.. read more
Evaluating the Use of Next Generation Reflow Profile Control for High Volume Electronics Manufacturing
In recent years,technological advances in electronics manufacturing have allowed high volume manufacturers to
significantly improve process control and documentation. Manufacturers have acceler
.. read more
Extending the Power of Boundary-Scan: System-Level Testing
Boundary-scan has achieved many of the goals envisioned by its original architects and today is in use in thousands
of production facilities around the world to test complex digital printed cir
.. read more
A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test
This paper will discuss:
a. Boundary scan as a key test tool that enables the leveraged test approach
b. The advantages of standardizing and reusing design verification tests and PLD programs i
.. read more
Investigation of the Effectiveness of Automated X-ray Inspection Systems in a High Volume – Low Mix SMT Line
The advent of miniature surface mount components coupled with increasing lead counts has posed tremendous
challenges during assembly. This is especially true in an Electronics Manufacturing Ser
.. read more
Comparison of X-ray Inspection Systems for BGA/CCGA Quality Assurance and Crack Detection
For high reliability applications,the use of x-ray technique has become an additional inspection requirement for
quality control and detection of unique defects due to manufacturing of advanced
.. read more
A Case Study of In-Process Inspection Methods to Improve First Pass Yields
The electronics content of many consumer products has increased substantially over the past decade. Several of the
electronics added to the automobile control vehicle functions that have a dire
.. read more
Management of DPMO Metrics Reduces the Cost of PCB Assembly
Manufacturers can use DPMO metrics to reduce the cost of PCB assembly with fewer resources. DPMO data can be
used for predicting the fault spectrum on future products,quoting new business,setti
.. read more
Increasing Operating Margins in a Down Economy: Case Studies in SMT Production Monitoring Software & Applications
Shrinking profits and overcapacity have forced Electronics Manufacturers to squeeze every last penny out of Site
Operations. To reduce conversion costs in a short timeframe,some facilities have
.. read more
Manufacturing Process Management – Facilitating Stage 3 of Manufacturing Outsourcing
The slowdown in the electronics industry has allowed the management of electronics products manufacturers to
dedicate time to reconsider their manufacturing strategy. For most of these companie
.. read more
Increased Productivity in X-ray Inspection – The Role of ADR Technology
The economic environment in the electronics
industry has changed dramatically over the last two
years. The focus on the production floor has moved
from increasing capacity to improving the yiel
.. read more
Biologically Inspired Vision Makes for Smarter PCBA Manufacturing Technology - New Technologies Overcome Fundamental Limitations of Conventional Optical Inspection Methods
For test engineers and managers,automated optical
inspection (AOI) systems have emerged as a
countermeasure to the growing threats of lost
physical or electrical access to assembled PCB. AOI
sy
.. read more
2D Off-line X-ray Inspection in the SMT Production Line: Working Towards the Zero-Defect Goal
The goal of SMT production is a zero-defect process in which flawed materials never get to the customer; however,
in the ideal scenario,zero-defect production would mean that no flawed products
.. read more
Practical Implementation of Lead-Free Soldering The Experience of the Japanese Electronics Industry
With the US military now committed to the phasing
out of lead-containing solders via the Joint Group on
Pollution Prevention (JG-PP) the electronics industry
has moved beyond debate about wheth
.. read more
Robust Optimization of a Lead Free SMT Process
This paper will focus on Dr. Taguchi’s Robust Engineering methodology,measurement methods and experimental
results for the optimization of a lead free SMT process for use in an Automotive Elect
.. read more
Reduction of Hazardous Substances vs. Recycling
Much of the environmental emphasis is currently on elimination of undesirable elements and compounds such as
lead or halogens. The unintended consequences are huge in terms of diversion of reso
.. read more
Assessing Circuit Pack Design and Assembly for Environmental Performance and Sustainability
Circuit pack assembly involves the use of numerous materials and processes of environmental concern,including
electronic components and associated assembly operations. It is necessary to be abl
.. read more
Life-Cycle Comparison of Energy Use during the Application of Lead-Free Solders
The energy consumed during the reflow assembly of printed wiring board assemblies is expected to be environmentally
significant within the solder product life-cycle. Wide differences in the mel
.. read more
Solder Joint Thermal Fatigue Damage Evaluation by a Simplified Method
In the present study,a simplified analysis methodology is used to evaluate thermal fatigue damage of solder joints of
a leadless ceramic chip carrier (LCCC) or a leadless chip capacitor/resisto
.. read more
An Efficient Test Model to Study the Board Level Reliability For High I/O Flip Chip BGA Packages
With the increasing demands of complex functions in a single chipset or microprocessor,the development of large
size high I/O Flip Chip BGA (FCBGA) package becomes very important in recent year
.. read more
Solderability Testing Methodologies for BGA Packages
Solderability testing is carried out at the IC (Integrated Circuit) manufacturer’s end to evaluate the quality of the IC
package terminals in terms of solder wetting ability. Current industrial
.. read more
Implementation of High I/O Count 1mm Pitch BGA Technology
Electronic package size reduction and demand for increased functions within less board space make a challenge for
the PCB designer to find smaller footprint components that will out perform lar
.. read more
Board Level Interconnect Reliability Assessment of High I/O BGA Packages
To meet the complex design requirements of the electronics industry,there is an increased need for large size high
I/O BGA packages. The size of these large BGA packages (up to 50 mm2 and 1157+
.. read more
Mechanical Reliability of Fine Pitch Packages for use in Server and Mobile Electronic Packages
In both the server and portable electronic markets,monotonic mechanical overstress has become a primary issue in
manufacturing and field usage. Appropriate test methods,including four point ben
.. read more