Effects of Moisture Content on Permittivity and Loss Tangent of Printed Circuit Board Materials
Printed circuit board laminate datasheets provide permittivity (dielectric constant,Dk) and loss tangent (dissipation factor,Df) values that are used for specification and board design. But pas
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Event
IPC APEX EXPO 2010
Low Loss & Novel Halogen-Free Laminates for High Frequency Device Applications
In this paper,ITEQ demonstrates outstanding performance of new halogen-free and low loss laminates,IT-258GA,IT-168G,and IT-150D,for the coming halogen free generation,and higher frequency appli
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Event
IPC APEX EXPO 2010
Determining Dielectric Properties of High Frequency PCB Laminate Materials
This paper will focus on understanding the dielectric constant (dk) of high frequency laminate materials. The dissipation factor (df) and other electrical properties will be discussed as well,h
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Event
IPC APEX EXPO 2010
Design To Manufacturing Standards
• The Information Process
• Knowing the jargon (terms & definitions)
• Defining the requirements
• Expansion of Documentation standards
• Document Grade and Completeness
• Relationship of CAD/C
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Event
IPC APEX EXPO 2010
IPC/JEDEC J-STD-609AMarking and Labeling of Components,PCBs and PCBAs to Identify Lead (Pb),Lead-Free (Pb-Free) and Other Attributes
• The standard covers marking and labellingof both tin-lead and lead-free components,boards and solders used in 2ndlevel assembly.
• Other areas covered include board base material type and sur
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Event
IPC APEX EXPO 2010
The Value of IPC-2152
Current carrying capacity in printed board design is technology dependent and an element of printed circuit board thermal
management. Conductor temperature rise as a function of current is depe
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Event
IPC APEX EXPO 2010
Thermal Cycling Reliability Screening of Multiple Pb-free Solder Ball Alloys
Thermal cycling tests were conducted using two different ceramic ball grid array (CBGA) test vehicles having balls comprised of nine different Pb free solder alloys. The experiment was designed
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Event
IPC APEX EXPO 2010
Achieving High Reliability Low Cost Lead-Free SAC Solder Joints Via Mn Or Ce Doping
In this study,the reliabilities of low Ag SAC alloys doped with Mn or Ce (SACM or SACC) were evaluated under JEDEC drop,dynamic bending,thermal cycling,and cyclic bending test conditions agains
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Event
IPC APEX EXPO 2010
Low-Silver BGA Assembly Phase II – Reliability Assessment Fifth Report: Preliminary Thermal Cycling Results
Some ball grid array suppliers are migrating their sphere alloys from SAC305 (3% Ag) or SAC405 (4% Ag) to alloys with lower silver contents. There are numerous perceived reliability benefits to
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Event
IPC APEX EXPO 2010
Manufacturing Equipment: From Single Machines to Integrated High Performance Systems
- Production Processes
- Manual Production Line (2000)
- Fully Automated System (today)
- Cell Interconnection
- Encapsulation Materials
- Encapsulation Process
- Influence of Temperature
- Enc
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Event
IPC APEX EXPO 2010
Creep Corrosion of OSP and ImAg PWB Finishes
With increasing adoption of lead-free PWB surface finishes,along with increasing product deployments in more corrosive
environments,the electronics industry is observing increased occurrences o
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Event
IPC APEX EXPO 2010
An Investigation into Hand Sanitizers and Hand Lotions and Potential Risks to High Performance Electronics
As people become more concerned about the global outbreaks of various strains of influenza,more precautions are being taken with respect to personal hygiene. A common precaution involves the us
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Event
IPC APEX EXPO 2010
Relationship Between Via Size and Cleanliness
Microvia technology has many advantages: it requires a smaller designed area,which saves the board size and weight,using less space,allowing for a smaller PCB,which can results in lower costs,a
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Event
IPC APEX EXPO 2010
Where are REACH SVHC in Electronic Products and Parts?
The European REACH regulation (Regulation (EC) No 1907/2006) imposes requirements to declare and sometimes restrict the use of Substances of Very High Concern (SVHC). REACH affects all product
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Event
IPC APEX EXPO 2010
Round Robin Testing in Support of IPC J-STD-709: Combustion Sample Preparation Methods for Ion Chromatography Analysis of Br and Cl
This paper will present the results of a round robin study of sample combustion followed by ion chromatography (CIC) to measure the concentration of bromine and chlorine in electronic materials
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Event
IPC APEX EXPO 2010
Effect of Board Clamping System on Solder Paste Print Quality
Stencil printing technology has come a long way since the early 80’s when SMT process gained importance in the electronics
packaging industry. In those early days,components were fairly large,m
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Event
IPC APEX EXPO 2010
Stencil Design Considerations to Improve Drop Test Performance
Future handheld electronic products will be slimmer than today and deliver more functions,enabled by innovative electronics
packaging design using smaller components with greater I/Os assembled
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Event
IPC APEX EXPO 2010
Fighting the Undesirable Effects of Thermal Cycling
Most electronic assemblies comprise a number of chips,packages and similar components that are attached to Printed Circuit Boards (PCBs) or similar substrates,usually using solder joints. Also
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Event
IPC APEX EXPO 2010
Comparative Analysis of Solder Joint Degradation Using RF Impedance and Event Detectors
Under cycling loading conditions,solder joints are susceptible to fatigue cracking,which often initiates at the surface where the strain range is maximized. Event detectors have been widely use
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Event
IPC APEX EXPO 2010
Poor Metrology: The Hidden Cost
Doing more with less has been the standard operating procedure in manufacturing over the past ten years. Everyone is looking for areas where they can cut corners,maintain quality,and improve pr
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Event
IPC APEX EXPO 2010
Using DMAIC Methodology for MLP Reflow Process Optimization
The widely publicized and studied implementation of lead free solders has led to increased scrutiny on the solder joint formation for surface mount technology electronic components. During the
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Event
IPC APEX EXPO 2010
Head-On-Pillow Defect – A Pain in the Neck or Head-On-Pillow BGA Solder Defect
The head on pillow defect is becoming more common. This paper describes one such occurrence for an OEM and explains how it was dealt with. In this particular case it was solved by application o
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Event
IPC APEX EXPO 2010
A Novel Approach to Experimentally Create and Mitigate Head-in-Pillow Defects
One of the solder joint failures encountered frequently during Printed Circuit Board Assembly (PCBA) is due to Head-in-Pillow (HiP) defects. The primary cause of HiP defect is due to the warpag
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Event
IPC APEX EXPO 2010
Challenges toward Implementing a Halogen-Free PCB Assembly Process
The electronics industry continues to strive to provide more environmentally friendly products. This movement is partly due to legislation from various countries,partly due to public outcry fro
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Event
IPC APEX EXPO 2010
A Novel Halogen-Free Material for High Speed PCB
The mobile communication devices such as cell phones require high speed transmission of large volume data as well as reduction in size and weight. When signal is transmitted in high speed and f
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Event
IPC APEX EXPO 2010
Polyphenylene Ether Macromolecules. VI. Halogen Free Flame Retardant Epoxy Resins
An important criterion for dielectric materials used in the microelectronics industry is their flammability. Typically,flame
retardant epoxy resins use bromine-containing flame-retardants. In t
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Event
IPC APEX EXPO 2010
Stencil Options for Printing Solder Paste for .3 Mm CSP’s and 01005 Chip Components
Printing solder paste for very small components like .3mm pitch CSP’s and 01005 Chip Components is a challenge for the printing process when other larger components like RF shields,SMT Connecto
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Event
IPC APEX EXPO 2010
Effect of Squeegee Blade on Solder Paste Print Quality
The solder paste deposition process is viewed by many in the industry as the leading contributor of defects in the Surface Mount Technology (SMT) assembly process. As with all manufacturing pro
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Event
IPC APEX EXPO 2010
Stencil Printing Transfer Efficiency of Circular vs. Square Apertures with the Same Solder Paste Volume
It is frequently noted in surface mount printed circuit board assembly that most solder defects can be traced back to the stencil printing process. In addition,continuous miniaturization trends
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Event
IPC APEX EXPO 2010
Drop Test Performance of A Medium Complexity Lead-Free Board After Assembly and Rework
The mechanical behavior of printed circuit assemblies (PCA) at high strain rates is very important for the reliability of products used in harsh environments. The transition to Pb-free material
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Event
IPC APEX EXPO 2010
Pad Cratering Evaluation of PCB
Pad cratering in the PCB is a new failure mode encountered in electronic assemblies,particularly in lead-free products. The
failure mechanisms and root causes are not yet fully understood,and l
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Event
IPC APEX EXPO 2010
Effect of Environmental Stress and Bias Conditions on Reliability of Embedded Planar Capacitors
The reliability of an embedded planar capacitor laminate under a variety of environmental stress and bias conditions was investigated. The dielectric consisted of a composite of BaTiO3 particle
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Event
IPC APEX EXPO 2010
Basic PCB Level Assembly Process Methodology for 3D Package-on-Package
The motivation for developing higher density IC packaging continues to be the market and the consumers’ expectation that
each new generation of products furnish greater functionality. The minia
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Event
IPC APEX EXPO 2010
Throughput vs. Wet-Out Area Study for Package on Package (PoP) Underfill Dispensing
Package on Package (PoP) has become a relatively common component being used in mobile electronics as it allows for saving space in the board layout due to the 3D package layout. To insure devi
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Event
IPC APEX EXPO 2010
Reliability Evaluation of One-Pass and Two-Pass Techniques of Assembly for Package on Packages under Torsion Loads
Package on Packages (PoP) find use in applications that require high performance with increased memory density. One of the
greatest benefits of PoP technology is the elimination of the expensiv
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Event
IPC APEX EXPO 2010
Progress in Developing Industry Standard Test Requirements for Pb-Free Solder Alloys
Recently,the industry has seen the development of a wide range of new Pb-free alloys. A significant element of uncertainty within the industry regarding these new alloys is the lack of defined
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Event
IPC APEX EXPO 2010
Characterizing the Lead-Free Impact on PCB Pad Craters
Pad cratering in Printed Circuit Boards (PCBs) is typically associated with lead-free products. This paper addresses laminate materials and the failures associated with the higher Pb-Free reflo
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Event
IPC APEX EXPO 2010
Challenges in Reflow Profiling Large and High Density Ball Grid Array (BGA) Packages Using Backward Compatible Assembly Processes
Backward Compatibility of Pb free SnAgCu (SAC) solders with conventional SnPb soldering has been a subject of considerable interest since the introduction of Pb free solders earlier in this dec
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Event
IPC APEX EXPO 2010
Solder Creep-Fatigue Model Parameters for SAC & Snag Lead-Free Solder Joint Reliability Estimation
For many of the Pb-free solders required under the European RoHS directive,there is now sufficient information,primarily in the form of the results of accelerated thermal cycling of various lev
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Event
IPC Midwest 2009
Constitutive and Failure Behavior of SnAgCu Solder Joints
Constitutive and failure descriptions of SnAgCu solder alloys are of great interest at the present. Commonly,constitutive models that have been successfully used in the past for Sn-Pb solders a
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Event
IPC Midwest 2009
Filling in the Gaps in Lead-Free Reliability Modeling and Testing
This presentation discusses critical material properties and test data that are often overlooked in the introduction of new lead-free solder alloys,but are critical to alloy comparison and the
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Event
IPC Midwest 2009
Strategies for Fighting Counterfeiting Knowledge 101 Your Weapon Against Counterfeiting
#NAME?
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Event
IPC Midwest 2009
Suspect / Counterfeit Electronic Components and Risk Mitigation
In this presentation,numerous examples of counterfeited parts are provided along with the means of identification for the respective technique utilized in production.
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Event
IPC Midwest 2009
The Impact of Converting Flex Circuits From HASL to a RoHS Compliant Surface Finishes
This paper will explore the most common alternatives to hot air-leveled solder (HASL) as a finish for flex circuits and some of the issues one may want to be aware of when converting. Whether t
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Event
IPC Midwest 2009
Design Considerations for High Reliability PCB
- History & Importance of PCB - Environmental Initiatives - Reliability Consideration With High Temp Processing - Reliability Considerations for Materials to withstand Lead-Free Assembly
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Event
IPC Midwest 2009
Pb-Free Reflow,PCB Degradation,and the Influence of Moisture Absorption
Cracking and delamination defects in printed circuit boards (PCBs) during elevated thermal exposure have always been a concern for the electronics industry. However,with the increasing spread o
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Event
IPC Midwest 2009
Proposed Standardizations of Lead Free Alloy Testing
Although lead free assembly is now widely adopted the industry is still exploring a variety of options for lead free alloys. Attempts to standardize on a single alloy for either reflow or wave
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Event
IPC Midwest 2009