Creep Corrosion in Electronics – A Panel Discussion
On May 1, 2024, a panel of industry experts discussed the root causes of creep corrosion in electronics, along with relevant testing methods and effective mitigation strategies. The session explored how creep corrosion—primarily caused by the reaction of copper with sulfur—can be addressed through manufacturing choices such as solder mask, surface finishes, conformal coatings, and enclosure designs, as well as operational measures like filtration. The panel also reviewed various harsh environmental test methods used to evaluate product susceptibility to creep corrosion. Panelists included Randy Schueller, Ph.D. (Dell), Christopher Genthe (Rockwell Automation), and Paul Leone (Rockwell Automation).