Effects of Conductor Surface Condition on High Frequency Loss
Efforts to reduce high frequency signal losses associated with dielectric materials have driven development and
commercialization of more cost effective low loss laminate materials. These devel
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Event
IPC APEX EXPO 2004
Electrical Characteristics of High Speed Materials
This paper will discuss the two primary transmission components that concern designers today. These components affect the
signal integrity of all high-speed transmissions in printed circuit boa
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Event
IPC APEX EXPO 2004
High Speed Interconnects: The Impact of Spatial Electrical Properties of PCB due to Woven Glass Reinforcement Patterns
The impedance and electrical property variation resulting from spatial patterns in woven glass reinforced laminate materials
are greatly impacting high speed interconnect designs. As the transf
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Event
IPC APEX EXPO 2004
Power Consumption and Closed-loop Nitrogen Control Considerations in Lead-free Reflow
When transitioning to lead-free reflow,consideration should be given to the additional costs of operation,above and beyond
material costs.1 Impacts to the overall reflow process should be caref
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Event
IPC APEX EXPO 2004
Optimizing Your Reflow Profile for Maximum Productivity and Profitability
Successful reflow soldering is a key to productivity and profitability,yet many assemblers may be using a nonoptimized
reflow profile.
Years ago,when IR ovens were the norm and solder pastes we
.. read more
Event
IPC APEX EXPO 2004
Moisture and Reflow Sensitivity Evaluations of SMT Packages as a Function of Reflow Profile at Eutectic and Lead Free Temperatures
Epoxy molding compounds are used extensively in the electronics industry to encapsulate surface mount Integrated Circuits
(ICs). The primary purpose of encapsulating the SMT package using these
.. read more
Event
IPC APEX EXPO 2004
Transitioning from a Reactive to a Proactive Manufacturing Culture
We often hear or use the terms “World Class Manufacturing” or “Best in Class Manufacturing” in reference to our
manufacturing operation or perhaps a competitor’s or supplier’s manufacturing ope
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Event
IPC APEX EXPO 2004
Process Capability Studies – The Better Way
To estimate the ability of a process to perform according to the product’s design (i.e.,specification),process capability
indices (Cp,Cpk,etc.) are used. What most people fail to realize,howeve
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Event
IPC APEX EXPO 2004
The “Only Other” Sure Thing in Life
Today,there are only three certainties in a circuit board market that for the last three years has proven anything but certain:
death,taxes,and military business. As the overall North American
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Event
IPC APEX EXPO 2004
Continuous Improvement: Know Thy Customer: Customer Relationship Management Pays
The overall mission and foundation of business today,as it was yesterday and undoubtedly will be tomorrow,is to maximize
customer service. Customer Relationship Management (CRM),although a rela
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Event
IPC APEX EXPO 2004
How to Take Care of Loyal Customers
Loyal customers are customers who will pay premium price for exceptional products and services,refer other customers to
buy products and services,buy a whole range of products and services from
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Event
IPC APEX EXPO 2004
Lean and Continuous Improvement
Lean and Continuous Improvement are distinct performance improvement strategies. Each has its own objective and
methodology and is highly inter-woven. Lean Manufacturing uses the strategy of Ka
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Event
IPC APEX EXPO 2004
Three-dimensional Simulations of Current Density Distributions for Patterned Wafers and PCB's
Mass transfer effects and reactor design play an important role in the plating process of electronic interconnects. To improve
the behaviour and performance of the plating reactors used for ele
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Event
IPC APEX EXPO 2004
Enhancing the Performance of a Graphite Direct Metalization Process
Colloidal graphite direct metalization processes have proven their usefulness as a replacement for electroless copper. This is
especially the case in high technology and quick turn applications
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Event
IPC APEX EXPO 2004
Using Periodic Pulse Reverse (PPR) for Plating Thick Panel Applications
There is increased interest in the printed wiring board (PWB) industry with regards to the use of periodic pulse reverse (PPR)
plating to electroplate printed circuit boards. PPR plating offers
.. read more
Event
IPC APEX EXPO 2004
Process for Plugging Low to High Aspect Ratio Through-Holes with Polymer Thick Film Conductive Ink in Production Volumes
With an increasing number of designers specifying conductive material for plugging through-holes,a more robust process to
produce 100% fill is needed for the whole range of aspect ratios. With
.. read more
Event
IPC APEX EXPO 2004
Copper Electroplating Technology for Microvia Filling
This paper describes a copper electroplating enabling technology for filling microvias.
Driven by the need for faster,smaller and higher performance communication and electronic devices,build-u
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Event
IPC APEX EXPO 2004
Enhancing Interlaminar Bond Strength for High Performance Resin Systems and Liquid Photoimageable Soldermasks with an Organo-metallic Copper Surface Treatment Process
The technology shift toward higher performance (low Dk,low Df,faster signal speeds) resin materials for high reliability
high layer count multlayer interconnect devices is moving rapidly. PWB f
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Event
IPC APEX EXPO 2004
PTFE Wettability for Electroless Copper and Direct Metallization
PTFE material is very hydrophobic and among the most difficult to deposit electroless copper or direct metallization. These
materials have very low friction,which makes a surface non-wettable.
.. read more
Event
IPC APEX EXPO 2004
Peroxy-Sulfuric Oxide Replacements – A Pathway to Improved Technology for Fine Line Processes
Traditional reduced black oxide processes for inner layer bonding have been superseded by a newer generation of peroxidesulfuric
texturing processes. These lower cost processes,based on an orga
.. read more
Event
IPC APEX EXPO 2004
High Frequency Conductor Loss Impact of Oxide and Oxide Alternative Processes
In most of today's high speed digital interconnects,the signal loss associated with the printed circuit board (PCB) is the
dominate factor. Material selection,trace geometry,and choice of coppe
.. read more
Event
IPC APEX EXPO 2004
Advanced Microvia Design
Microvias are the fastest growing new technology for printed circuits. Once you understand the basics,the advanced topics
bring the real advantage to light. This talk will highlight the procedu
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Event
IPC APEX EXPO 2004
Automatic Generation of RC Network Models for a BGA Package
The need for dynamic compact models for Integrated Circuits (ICs) is a well-recognized problem in electronics cooling
simulations of electronic systems. Simplified thermal models have been repo
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Event
IPC APEX EXPO 2004
Signal Integrity Analysis Techniques used to Characterize PCB Substrates
The electrical properties of PCB substrates are one of the primary factors used in designing high-frequency printed circuit
boards. The loss tangent is the electrical property used by material
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Event
IPC APEX EXPO 2004
Insertion Loss,Eye Pattern and Crosstalk Analysis of Mixed Dielectric Striplines (Simulation and Measurement)
As digital data rates reach 5Gb/s,10Gb/s and beyond,digital designers are finding it increasingly difficult to meet their
design constraints using FR4. While there are a host of alternative mat
.. read more
Event
IPC APEX EXPO 2004
FPGA on Board
Whilst the number of new ASIC designs has decreased over the last couple of years,there has been a dramatic increase in the
number of FPGA designs implemented. Not only have the number of desig
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Event
IPC APEX EXPO 2004
Conquer Tombstoning in Lead-Free Soldering
Tombstoning of SnAgCu is affected by the solder composition. At vapor phase soldering,both wetting force and wetting
time at a temperature well above the melting point have no correlation with
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Event
IPC APEX EXPO 2004
Tin Whisker Growth - Substrate Effect Understanding CTE Mismatch and IMC Formation
The hypothesis that the “whisker growth phenomenon” in electrodeposited tin is a re-crystallization process driven by stress
has gained popularity among leading research institutes and industri
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Event
IPC APEX EXPO 2004
Test and Inspection of Lead-Free Assemblies
Major industrial nations,around the world,are rapidly moving to eliminate lead from the electronic manufacturing processes.
While some companies are taking advantage of the situation and are us
.. read more
Event
IPC APEX EXPO 2004
Erosion of Copper and Stainless Steels by Lead-Free-Solders
An issue that has emerged from the increasing use by the electronics industry of lead-free solders in mass production wave
soldering is the erosion of the copper of printed circuit board patter
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Event
IPC APEX EXPO 2004
Effect of Transient Thermal Profiles in Wave Soldering Processes on Connector Performance
Developing lead free connector products involves at least two distinct steps: removing the lead from the product and ensuring
the product has sufficient thermal stability. Lead is most commonly
.. read more
Event
IPC APEX EXPO 2004
Reliability Testing and Failure Analysis of Lead-Free Solder Joints under Thermo-Mechanical Stress
The commercial use of lead-free solder has been making significant gains worldwide in recent years. To identify the effects
of thermo-mechanical stress on Sn-Ag-Cu and Sn-Zn-Bi solder with diff
.. read more
Event
IPC APEX EXPO 2004
A Reliability Comparison of Different Lead-Free Alloys and Surface Finishes in SMT Assembly
As we inch towards the somewhat shifting deadlines towards lead (Pb) restriction in Japan and Europe,there is an increase
seen in the amount of studies performed for electronics assemblies sold
.. read more
Event
IPC APEX EXPO 2004
Lead-Free and Mixed Assembly Solder Joint Reliability Trends
This paper presents a quantitative analysis of solder joint reliability data for lead-free Sn-Ag-Cu (SAC) and mixed assembly
(SnPb + SAC) circuit boards based on an extensive,but non-exhaustive
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Event
IPC APEX EXPO 2004
Effect of Lead-Free Alloys on Voiding at Microvia
For SnAgCu solders,the voiding rate at microvia was studied with the use of simulated microvia,and was the lowest with
95.5Sn3.8Ag0.7Cu and 95.5Sn3.5Ag1Cu. The voiding rate increased with decre
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Event
IPC APEX EXPO 2004
Assembly,Rework and Reliability of Lead-free FCBGA Soldered Component
Movements to lead-free assembly are being influenced by legislative and market requirements. Specifically Europe has
passed legislation requiring the removal of lead from electronics assembly b
.. read more
Event
IPC APEX EXPO 2004
Development of Assembly and Rework Processes for Large and Complex PCBs Using Lead-Free Solder
The continued functional densification and integration in networking products is driving the need to study large form factor
printed circuit boards that use high I/O packages (either ceramics c
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Event
IPC APEX EXPO 2004
Lead Free Conversion Analysis for Multiple PWB/Component Materials and Finishes using Quality and Reliability Testing
The world-wide movement to phase out lead from electronic products presents many challenges for companies throughout
the electronics supply chain. The University of Massachusetts Lowell has bro
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Event
IPC APEX EXPO 2004
Design and Development of a High Performance Wirebond BGA Package
As the need for higher performance,higher I/O count packaging solutions at lower costs continues to grow,opportunities
exist to support these applications with higher performance wire bonded pa
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Event
IPC APEX EXPO 2004
Development of Epoxy Mold Compound for Lead Free Soldering of Fine Pitch and Stacked Die BGA Packages
A new,green epoxy mold compound has been developed to encapsulate fine pitch PBGA and 3D-stacked die CSP packages.
When evaluated on these packages,the compound provided very good wire sweep pe
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Event
IPC APEX EXPO 2004
Finite Element Analysis of Flip Chip Ball Grid Array Packages for BGA Life Prediction: 2D,3D or Axisymmetric?
A variety of mechanical and thermal stress related problems related to Flip Chip Ball Grid Array Packages (FCBGAs) are
often solved by the Finite Element Method. Often,the question for the stre
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Event
IPC APEX EXPO 2004
Solder Joint Reliability Qualification of Various Component Mounting Modification Configurations Using Thermal Cycle Testing
The selection and use of solder joint modification configurations for printed wiring assemblies has traditionally been a design
specific activity. The implementation and use of a standardized s
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Event
IPC APEX EXPO 2004
Characterization of PCB Plated-Thru-Hole Reliability using Statistical Analysis
Various test methods are used to characterize the PCB plated-thru-hole reliability. One such method is the Interconnect Stress
Test (IST). The results from this test are often used to qualify P
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Event
IPC APEX EXPO 2004
Lead Free and Other Process Effects on Conductive Anodic Filamentation Resistance of Glass Reinforced Epoxy Laminates
Conductive Anodic Filamentation is a subsurface failure mode for woven glass reinforced laminates (FR4) materials,where a
copper salt filament allows bridging between via walls or other copper
.. read more
Event
IPC APEX EXPO 2004
Lead-Free Soldering: DOE Study to Understand its Affect on Electronic Assembly Defluxing
Lead-free alloys under consideration have physical properties,which may directly impact industry standard electronic assembly
cleaning processes. The purpose of this study is to evaluate how th
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Event
IPC APEX EXPO 2004
Are Lead-free Assemblies Especially Endangered by Climatic Safety?
The ever-increasing use of high frequency in high density interconnect (HDI) assemblies,combined with the worldwide
move toward lead-free manufacturing,has initiated a closer scrutiny towards e
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Event
IPC APEX EXPO 2004
Lead Free Assembly of Chip Scale Packages
Chip scale packages (CSPs) are widely used in portable electronic products where there is also a growing trend to lead free
assembly. Many CSP designs will meet the thermal cycle or thermal sho
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Event
IPC APEX EXPO 2004
Reliability Assessment of CSP Underfill Methods
The miniaturization trend in electronics has proliferated the use of Chip Scale Packages (CSPs) in electronics assembly. CSPs
used in portable devices are subjected to harsh mechanical and ther
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Event
IPC APEX EXPO 2004
Mechanical Bending Technique for Determining CSP Design and Assembly Weaknesses
A cyclic board-bending technique has been developed to ensure a reproducible multiaxial stress state at the Chip
Size Package (CSP) solder fillet. Mechanically stressing the package serves as a
.. read more
Event
IPC APEX EXPO 2004
Non-Telecom Optoelectronics
When we think of optoelectronics in the USA,we automatically think of telecom applications. These fueled huge growth at
the turn of the millennium,and even after the bubble burst in 2001-2,tele
.. read more
Event
IPC APEX EXPO 2004