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Effects of Conductor Surface Condition on High Frequency Loss

Efforts to reduce high frequency signal losses associated with dielectric materials have driven development and commercialization of more cost effective low loss laminate materials. These devel .. read more
Author(s)
Martin Bayes,Al Horn
Event
IPC APEX EXPO 2004

Electrical Characteristics of High Speed Materials

This paper will discuss the two primary transmission components that concern designers today. These components affect the signal integrity of all high-speed transmissions in printed circuit boa .. read more
Author(s)
Eric Montgomery
Event
IPC APEX EXPO 2004

High Speed Interconnects: The Impact of Spatial Electrical Properties of PCB due to Woven Glass Reinforcement Patterns

The impedance and electrical property variation resulting from spatial patterns in woven glass reinforced laminate materials are greatly impacting high speed interconnect designs. As the transf .. read more
Author(s)
Gary Brist,Bryce Horineds,Gary Long
Event
IPC APEX EXPO 2004

Power Consumption and Closed-loop Nitrogen Control Considerations in Lead-free Reflow

When transitioning to lead-free reflow,consideration should be given to the additional costs of operation,above and beyond material costs.1 Impacts to the overall reflow process should be caref .. read more
Author(s)
Marc Apell,Jon Dautenhahn,Tad Formella,Jim Morris
Event
IPC APEX EXPO 2004

Optimizing Your Reflow Profile for Maximum Productivity and Profitability

Successful reflow soldering is a key to productivity and profitability,yet many assemblers may be using a nonoptimized reflow profile. Years ago,when IR ovens were the norm and solder pastes we .. read more
Author(s)
Bjorn Dahle,Ronald C. Lasky
Event
IPC APEX EXPO 2004

Moisture and Reflow Sensitivity Evaluations of SMT Packages as a Function of Reflow Profile at Eutectic and Lead Free Temperatures

Epoxy molding compounds are used extensively in the electronics industry to encapsulate surface mount Integrated Circuits (ICs). The primary purpose of encapsulating the SMT package using these .. read more
Author(s)
Vijay Gopalakrishnan,Vivek Venkataraman,Robert Murcko,Krishnaswami Srihari,Scott J. Anson
Event
IPC APEX EXPO 2004

Transitioning from a Reactive to a Proactive Manufacturing Culture

We often hear or use the terms “World Class Manufacturing” or “Best in Class Manufacturing” in reference to our manufacturing operation or perhaps a competitor’s or supplier’s manufacturing ope .. read more
Author(s)
Joe Belmonte
Event
IPC APEX EXPO 2004

Process Capability Studies – The Better Way

To estimate the ability of a process to perform according to the product’s design (i.e.,specification),process capability indices (Cp,Cpk,etc.) are used. What most people fail to realize,howeve .. read more
Author(s)
D.L. Santos,N. Msimang,S. Dogdu
Event
IPC APEX EXPO 2004

The “Only Other” Sure Thing in Life

Today,there are only three certainties in a circuit board market that for the last three years has proven anything but certain: death,taxes,and military business. As the overall North American .. read more
Author(s)
Mike Hill
Event
IPC APEX EXPO 2004

Continuous Improvement: Know Thy Customer: Customer Relationship Management Pays

The overall mission and foundation of business today,as it was yesterday and undoubtedly will be tomorrow,is to maximize customer service. Customer Relationship Management (CRM),although a rela .. read more
Author(s)
David Shaffer
Event
IPC APEX EXPO 2004

How to Take Care of Loyal Customers

Loyal customers are customers who will pay premium price for exceptional products and services,refer other customers to buy products and services,buy a whole range of products and services from .. read more
Author(s)
N.T. 'Bala' Balakrishnan
Event
IPC APEX EXPO 2004

Lean and Continuous Improvement

Lean and Continuous Improvement are distinct performance improvement strategies. Each has its own objective and methodology and is highly inter-woven. Lean Manufacturing uses the strategy of Ka .. read more
Author(s)
Dirk Hooiman
Event
IPC APEX EXPO 2004

Three-dimensional Simulations of Current Density Distributions for Patterned Wafers and PCB's

Mass transfer effects and reactor design play an important role in the plating process of electronic interconnects. To improve the behaviour and performance of the plating reactors used for ele .. read more
Author(s)
G. Nelissen,B. Van den Bossche,M. Purcar,J. Deconinck
Event
IPC APEX EXPO 2004

Enhancing the Performance of a Graphite Direct Metalization Process

Colloidal graphite direct metalization processes have proven their usefulness as a replacement for electroless copper. This is especially the case in high technology and quick turn applications .. read more
Author(s)
Lee Burger,Roger Bernards,Michael Carano,Beth LaFayette
Event
IPC APEX EXPO 2004

Using Periodic Pulse Reverse (PPR) for Plating Thick Panel Applications

There is increased interest in the printed wiring board (PWB) industry with regards to the use of periodic pulse reverse (PPR) plating to electroplate printed circuit boards. PPR plating offers .. read more
Author(s)
Erik Reddington,Gary Hamm,Mark Kapeckas,Wade Sonnenberg,Leon Barstad,Mark Lefebvre,Ray Cruz
Event
IPC APEX EXPO 2004

Process for Plugging Low to High Aspect Ratio Through-Holes with Polymer Thick Film Conductive Ink in Production Volumes

With an increasing number of designers specifying conductive material for plugging through-holes,a more robust process to produce 100% fill is needed for the whole range of aspect ratios. With .. read more
Author(s)
Michael O’Hanlon,Lynne Dellis
Event
IPC APEX EXPO 2004

Copper Electroplating Technology for Microvia Filling

This paper describes a copper electroplating enabling technology for filling microvias. Driven by the need for faster,smaller and higher performance communication and electronic devices,build-u .. read more
Author(s)
Mark Lefebvre,George Allardyce,Masaru Seita,Hideki Tsuchida,Masaru Kusaka,Shinjiro Hayashi
Event
IPC APEX EXPO 2004

Enhancing Interlaminar Bond Strength for High Performance Resin Systems and Liquid Photoimageable Soldermasks with an Organo-metallic Copper Surface Treatment Process

The technology shift toward higher performance (low Dk,low Df,faster signal speeds) resin materials for high reliability high layer count multlayer interconnect devices is moving rapidly. PWB f .. read more
Author(s)
Michael Carano,Lee Burger,Al Kucera,Roger Bernards
Event
IPC APEX EXPO 2004

PTFE Wettability for Electroless Copper and Direct Metallization

PTFE material is very hydrophobic and among the most difficult to deposit electroless copper or direct metallization. These materials have very low friction,which makes a surface non-wettable. .. read more
Author(s)
Lou Fierro
Event
IPC APEX EXPO 2004

Peroxy-Sulfuric Oxide Replacements – A Pathway to Improved Technology for Fine Line Processes

Traditional reduced black oxide processes for inner layer bonding have been superseded by a newer generation of peroxidesulfuric texturing processes. These lower cost processes,based on an orga .. read more
Author(s)
Abayomi Owei,Hiep Nguyen,David Ormerod,Jeff Sargeant
Event
IPC APEX EXPO 2004

High Frequency Conductor Loss Impact of Oxide and Oxide Alternative Processes

In most of today's high speed digital interconnects,the signal loss associated with the printed circuit board (PCB) is the dominate factor. Material selection,trace geometry,and choice of coppe .. read more
Author(s)
Gary Brist,Don Cullen
Event
IPC APEX EXPO 2004

Advanced Microvia Design

Microvias are the fastest growing new technology for printed circuits. Once you understand the basics,the advanced topics bring the real advantage to light. This talk will highlight the procedu .. read more
Author(s)
Happy Holden
Event
IPC APEX EXPO 2004

Automatic Generation of RC Network Models for a BGA Package

The need for dynamic compact models for Integrated Circuits (ICs) is a well-recognized problem in electronics cooling simulations of electronic systems. Simplified thermal models have been repo .. read more
Author(s)
Manoj Nagulapally,Sam Z. Zhao
Event
IPC APEX EXPO 2004

Signal Integrity Analysis Techniques used to Characterize PCB Substrates

The electrical properties of PCB substrates are one of the primary factors used in designing high-frequency printed circuit boards. The loss tangent is the electrical property used by material .. read more
Author(s)
Sean S. Mirshafiei,Dan Enos
Event
IPC APEX EXPO 2004

Insertion Loss,Eye Pattern and Crosstalk Analysis of Mixed Dielectric Striplines (Simulation and Measurement)

As digital data rates reach 5Gb/s,10Gb/s and beyond,digital designers are finding it increasingly difficult to meet their design constraints using FR4. While there are a host of alternative mat .. read more
Author(s)
Noel Hudson,Tammy Yost,Gregg Wildes
Event
IPC APEX EXPO 2004

FPGA on Board

Whilst the number of new ASIC designs has decreased over the last couple of years,there has been a dramatic increase in the number of FPGA designs implemented. Not only have the number of desig .. read more
Author(s)
Rick Stroot
Event
IPC APEX EXPO 2004

Conquer Tombstoning in Lead-Free Soldering

Tombstoning of SnAgCu is affected by the solder composition. At vapor phase soldering,both wetting force and wetting time at a temperature well above the melting point have no correlation with .. read more
Author(s)
Benlih Huang,Ning-Cheng Lee
Event
IPC APEX EXPO 2004

Tin Whisker Growth - Substrate Effect Understanding CTE Mismatch and IMC Formation

The hypothesis that the “whisker growth phenomenon” in electrodeposited tin is a re-crystallization process driven by stress has gained popularity among leading research institutes and industri .. read more
Author(s)
Y. Zhang,C. Fan,C. Xu,O. Khaselev,J. A. Abys
Event
IPC APEX EXPO 2004

Test and Inspection of Lead-Free Assemblies

Major industrial nations,around the world,are rapidly moving to eliminate lead from the electronic manufacturing processes. While some companies are taking advantage of the situation and are us .. read more
Author(s)
Michael J Smith
Event
IPC APEX EXPO 2004

Erosion of Copper and Stainless Steels by Lead-Free-Solders

An issue that has emerged from the increasing use by the electronics industry of lead-free solders in mass production wave soldering is the erosion of the copper of printed circuit board patter .. read more
Author(s)
Keith Sweatman,Shoichi Suenaga,Masaaki Yoshimura,Tetsuro Nishimura,Masahiko Ikeda
Event
IPC APEX EXPO 2004

Effect of Transient Thermal Profiles in Wave Soldering Processes on Connector Performance

Developing lead free connector products involves at least two distinct steps: removing the lead from the product and ensuring the product has sufficient thermal stability. Lead is most commonly .. read more
Author(s)
Alexandra L. M. Spitler,Robert D. Hilty
Event
IPC APEX EXPO 2004

Reliability Testing and Failure Analysis of Lead-Free Solder Joints under Thermo-Mechanical Stress

The commercial use of lead-free solder has been making significant gains worldwide in recent years. To identify the effects of thermo-mechanical stress on Sn-Ag-Cu and Sn-Zn-Bi solder with diff .. read more
Author(s)
Hirokazu Tanaka,Yuuichi Aoki,Makoto Kitagawa,Yoshiki Saito
Event
IPC APEX EXPO 2004

A Reliability Comparison of Different Lead-Free Alloys and Surface Finishes in SMT Assembly

As we inch towards the somewhat shifting deadlines towards lead (Pb) restriction in Japan and Europe,there is an increase seen in the amount of studies performed for electronics assemblies sold .. read more
Author(s)
Jignesh Rathod,Daryl Santos,Prashant Chouta,Joe Belmonte,Alan Rae
Event
IPC APEX EXPO 2004

Lead-Free and Mixed Assembly Solder Joint Reliability Trends

This paper presents a quantitative analysis of solder joint reliability data for lead-free Sn-Ag-Cu (SAC) and mixed assembly (SnPb + SAC) circuit boards based on an extensive,but non-exhaustive .. read more
Author(s)
Jean-Paul Clech
Event
IPC APEX EXPO 2004

Effect of Lead-Free Alloys on Voiding at Microvia

For SnAgCu solders,the voiding rate at microvia was studied with the use of simulated microvia,and was the lowest with 95.5Sn3.8Ag0.7Cu and 95.5Sn3.5Ag1Cu. The voiding rate increased with decre .. read more
Author(s)
Arnab Dasgupta,Benlih Huang,Ning-Cheng Lee
Event
IPC APEX EXPO 2004

Assembly,Rework and Reliability of Lead-free FCBGA Soldered Component

Movements to lead-free assembly are being influenced by legislative and market requirements. Specifically Europe has passed legislation requiring the removal of lead from electronics assembly b .. read more
Author(s)
Sam Yoon,Roy Wu,Jasbir Bath,Chris Chou,Samson Lam
Event
IPC APEX EXPO 2004

Development of Assembly and Rework Processes for Large and Complex PCBs Using Lead-Free Solder

The continued functional densification and integration in networking products is driving the need to study large form factor printed circuit boards that use high I/O packages (either ceramics c .. read more
Author(s)
David A. Geiger,Jin Yu,Dongkai Shangguan
Event
IPC APEX EXPO 2004

Lead Free Conversion Analysis for Multiple PWB/Component Materials and Finishes using Quality and Reliability Testing

The world-wide movement to phase out lead from electronic products presents many challenges for companies throughout the electronics supply chain. The University of Massachusetts Lowell has bro .. read more
Author(s)
Sammy Shina,Liz Harriman,Todd MacFadden,Donald Abbott,Richard Anderson,Helena Pasquito,Marie Kistler,David Pinsky,Mark Quealy,Karen Walters,Richard McCann,Al Grusby
Event
IPC APEX EXPO 2004

Design and Development of a High Performance Wirebond BGA Package

As the need for higher performance,higher I/O count packaging solutions at lower costs continues to grow,opportunities exist to support these applications with higher performance wire bonded pa .. read more
Author(s)
Clifford R Fishley,Abi Awujoola,Len Mora,Alex Lacap
Event
IPC APEX EXPO 2004

Development of Epoxy Mold Compound for Lead Free Soldering of Fine Pitch and Stacked Die BGA Packages

A new,green epoxy mold compound has been developed to encapsulate fine pitch PBGA and 3D-stacked die CSP packages. When evaluated on these packages,the compound provided very good wire sweep pe .. read more
Author(s)
Chinnu Brahatheeswaran
Event
IPC APEX EXPO 2004

Finite Element Analysis of Flip Chip Ball Grid Array Packages for BGA Life Prediction: 2D,3D or Axisymmetric?

A variety of mechanical and thermal stress related problems related to Flip Chip Ball Grid Array Packages (FCBGAs) are often solved by the Finite Element Method. Often,the question for the stre .. read more
Author(s)
Virendra Jadhav,Sanjeev Sathe,
Event
IPC APEX EXPO 2004

Solder Joint Reliability Qualification of Various Component Mounting Modification Configurations Using Thermal Cycle Testing

The selection and use of solder joint modification configurations for printed wiring assemblies has traditionally been a design specific activity. The implementation and use of a standardized s .. read more
Author(s)
David Hillman,Jennet Kramerand,Bryan James
Event
IPC APEX EXPO 2004

Characterization of PCB Plated-Thru-Hole Reliability using Statistical Analysis

Various test methods are used to characterize the PCB plated-thru-hole reliability. One such method is the Interconnect Stress Test (IST). The results from this test are often used to qualify P .. read more
Author(s)
Mark J. Tardibuono
Event
IPC APEX EXPO 2004

Lead Free and Other Process Effects on Conductive Anodic Filamentation Resistance of Glass Reinforced Epoxy Laminates

Conductive Anodic Filamentation is a subsurface failure mode for woven glass reinforced laminates (FR4) materials,where a copper salt filament allows bridging between via walls or other copper .. read more
Author(s)
Alan Brewin,Ling Zou
Event
IPC APEX EXPO 2004

Lead-Free Soldering: DOE Study to Understand its Affect on Electronic Assembly Defluxing

Lead-free alloys under consideration have physical properties,which may directly impact industry standard electronic assembly cleaning processes. The purpose of this study is to evaluate how th .. read more
Author(s)
Mike Bixenman,Dirk Ellis,Steve Owens
Event
IPC APEX EXPO 2004

Are Lead-free Assemblies Especially Endangered by Climatic Safety?

The ever-increasing use of high frequency in high density interconnect (HDI) assemblies,combined with the worldwide move toward lead-free manufacturing,has initiated a closer scrutiny towards e .. read more
Author(s)
Andreas Muehlbauer,Helmut Schweigart,Umut Tosun,Stefan Strixner
Event
IPC APEX EXPO 2004

Lead Free Assembly of Chip Scale Packages

Chip scale packages (CSPs) are widely used in portable electronic products where there is also a growing trend to lead free assembly. Many CSP designs will meet the thermal cycle or thermal sho .. read more
Author(s)
Yueli Liu,Guoyun Tian,Shyam Gale,R. Wayne Johnson,Pradeep Lall,Larry Crane
Event
IPC APEX EXPO 2004

Reliability Assessment of CSP Underfill Methods

The miniaturization trend in electronics has proliferated the use of Chip Scale Packages (CSPs) in electronics assembly. CSPs used in portable devices are subjected to harsh mechanical and ther .. read more
Author(s)
Mandar Painaik,Senthil Kanagavel,Daryl L. Santos
Event
IPC APEX EXPO 2004

Mechanical Bending Technique for Determining CSP Design and Assembly Weaknesses

A cyclic board-bending technique has been developed to ensure a reproducible multiaxial stress state at the Chip Size Package (CSP) solder fillet. Mechanically stressing the package serves as a .. read more
Author(s)
Mark R. Larsen,Ian R. Harvey,David Turner,Brent Porter,Jim Ortowski
Event
IPC APEX EXPO 2004

Non-Telecom Optoelectronics

When we think of optoelectronics in the USA,we automatically think of telecom applications. These fueled huge growth at the turn of the millennium,and even after the bubble burst in 2001-2,tele .. read more
Author(s)
Alan Rae
Event
IPC APEX EXPO 2004