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Recrystallization Principles Applied to Whisker Growth in Tin

Tin whiskers found in electroplated deposits are known to be single crystals which spontaneously grow. Thus whisker growth can be regarded as a grain growth phenomenon. In this paper we examine .. read more
Author(s)
Irina Boguslavsky,Peter Bush
Event
IPC APEX 2003

The 2002 - 2003 National Technology Roadmap for Electronic Interconnections

The OEM desires identified in the 2002 – 2003 roadmap clearly identify,through their emulators,the present and future needs of the products that the emulators represent. There are a total of ei .. read more
Author(s)
Interconnections
Event
IPC APEX 2003

Standization Effort in Japan in the Area of Optoelectronic Assembly Technology

We have organized in JPCA a committee for the standardization of optoelectronic assembly technology in collaboration with JIEP (Japan Institute of Electronics Packaging) with cooperation of JEI .. read more
Author(s)
Aki Shibata
Event
IPC APEX 2003

The Impact of “High Speed Systems” on Electrical and Optical Interconnect

High speed systems operating at speeds of 2GHz and above are placing increasing demands on the specifications of substrates and packaging of components used within these systems. BPA has review .. read more
Author(s)
Mike Campbell,Mark Hutton,Nick Pearne,Francesca Stern
Event
IPC APEX 2003

NEMI Update on Optoelectronics Initiatives

National Electronics Manufacturing Initiative (NEMI) initiated six projects in late 2001 and 2002 addressing key issues identified by the industry. These cover the areas of Fiber Management,Sig .. read more
Author(s)
Alan Rae
Event
IPC APEX 2003

Solderability Testing Methodologies for BGA Packages

Solderability testing is carried out at the IC (Integrated Circuit) manufacturer’s end to evaluate the quality of the IC package terminals in terms of solder wetting ability. Current industrial .. read more
Author(s)
Nopphadol Kongtongnok
Event
IPC APEX 2003

Solder Paste Wetting and Solder-Balling Evaluation: A Quantitative Statistical Approach Using DOE

The ability of a solder paste particles to coalesce and wet the Printed Wiring Board (PWB) and component lead is key to proper solder joint formation. Robust solder paste performance is needed .. read more
Author(s)
Scott Anson,Vijay Gopalakrishan,Robert Murcko,Krishnaswami Srihari
Event
IPC APEX 2003

Effect of No-clean Solder Paste and Flux on Reliability of High Frequency Circuits

The use of no-clean solder paste and flux has become widely accepted as a cost saver in the SMT assembly process. The presence of solder flux residues,solder mask,underfill or any SMT material .. read more
Author(s)
Michael J. Liberatore,Karen Tellefsen
Event
IPC APEX 2003

Selection of a Low VOC Conformal Coating

Boeing Commercial Electronics (BCE),a subsidiary of The Boeing Company,is a leading supplier of avionics and cabin management systems for the Boeing family of commercial airplanes. Boeing speci .. read more
Author(s)
Heather Clements
Event
IPC APEX 2003

Silicone UV Conformal Coating

As line speeds increase and production looks to decrease size and energy requirements,radiation curing becomes a more attractive technology option over the incumbent thermal and moisture curing .. read more
Author(s)
Khristopher E. Alvarez,James S. Tonge
Event
IPC APEX 2003

Solvent-Free Conformal Coatings – As Good as Conventional Types?

Conformal or protective coatings are widely used in the electronics industry today and are available in a large variety of different types and adjustments. The "classic" or conventional conform .. read more
Author(s)
Sven Kramer,Rüdiger Dietrich
Event
IPC APEX 2003

Protecting Automotive Electronics with Vacuum-Deposited Parylene Increasing Electronic Longevity in the Global Automotive Industry

Over the years,electronic components have become increasingly smaller and integrated. Spacing between components and line to line spacing has continually shrunk. This miniaturization has magnif .. read more
Author(s)
Lamar Young
Event
IPC APEX 2003

Real-Life Tin-Silver-Copper Alloy Processing

The world is stating to focus on tin-silver copper as the lead-free alloy of choice. This paper discusses the commercially available tin-silver-copper alloys and their processing and reliabilit .. read more
Author(s)
Alan Rae,Joe Belmonte,Leszek Hozer
Event
IPC APEX 2003

Preliminary Study on Lead-free Sn42Bi57Ag1 Solder Paste

With the growth of the concern on the environment,more and more efforts have been done to protect the earth,to minimize the pollution on the environment. The use of the lead free solder is repl .. read more
Author(s)
Ruifen Zhang,Wei-Bin Chen
Event
IPC APEX 2003

Effect of Alloy and Composition on Shelf Life of Water Soluble Solder Pastes

Shelf life is one of the most important characteristics of solder paste. Many pastes exhibit good print characteristics when fresh but then suffer rapid degradation. Although rosin based pastes .. read more
Author(s)
Gloria R. Biard
Event
IPC APEX 2003

SMT Assembly Process Comparison of Pb-free Alloy Systems

This paper provides an assembly process comparison of Pb-free alloys with a Sn/Pb alloy using a test vehicle designed to resemble real world manufacturing applications. Four different Pb-free a .. read more
Author(s)
Shafi Saiyed,Daryl Santos,James A. McLenaghan
Event
IPC APEX 2003

Electroplating and Properties of Lead-Free Finishes

Tin alloys such as Sn 0.7% Cu and Sn 2%Bi were identified as a viable alternative to tin-lead finish. Electroplating of these alloys is challenging because of great difference in reduction pote .. read more
Author(s)
O. Khaselev,I. S. Zavarine,C. Xu,C. Fan,Y. Zhang,J. Abys
Event
IPC APEX 2003

Whisker Prevention

The electronic industry is under extreme pressure to remove tin-lead solders from electronic components. Pure tin is one of the alternatives and may be the simplest system as a “drop-in” replac .. read more
Author(s)
Chen Xu,Chonglun Fan,Yun Zhang,Joseph A. Abys
Event
IPC APEX 2003

Eliminating Wave Solder Waste with Automatic Dross Reclamation

Wave Soldering continues to be a necessity for many applications in the PCB assembly arena. One of the drawbacks to the Wave Soldering process is the high cost associated with maintaining and o .. read more
Author(s)
Jim Morris
Event
IPC APEX 2003

Equipment Impacts of Lead Free Wave Soldering

The popular tin (Sn) rich lead free solders are causing severe corrosion to many of the materials used in today’s Wave Solder systems. Users are experiencing higher maintenance frequency and re .. read more
Author(s)
Jim Morris,Matthew J. O’Keefe
Event
IPC APEX 2003

Investigating Mass Imaging Lead Free Materials Using Enclosed Print Head Technology

Within the Surface Mount Assembly (S.M.A.) process,solder paste is primarily used as a mechanical and electrical connection. Solder paste is generally deposited using a mass imaging process,suc .. read more
Author(s)
Clive Ashmore,Rick Goldsmith
Event
IPC APEX 2003

Taking the Pain Out of Pb-Free Reflow

The introduction of Pb-free solder into the electronics industry has required changes to the standard surface mount process. The largest changes are in the reflow process,as Pb-free pastes requ .. read more
Author(s)
Paul N. Houston,Brian J. Lewis,Daniel F. Baldwin,Philip Kazmierowicz
Event
IPC APEX 2003

Formation and Growth of Intermetallics at the Interface between Lead-free Solders and Copper Substrates

Intermetallic formation and growth were studied for the alloys Sn-3.2Ag-0.8Cu,Sn-3.5Ag,Sn-0.7Cu,and Sn-9Zn. Coupons of solder joints (prepared by melting some of each solder alloy on a copper-p .. read more
Author(s)
T.A. Siewert,Y.C. Madeni,S. Liu
Event
IPC APEX 2003

Testing and Analysis of Surface Mounted Lead Free Soldering Materials and Processes

The Massachusetts Toxics Use Reduction Institute (TURI) has sponsored a consortium of Massachusetts based corporations to investigate lead-free (Pb-free) surface mount soldering technology. The .. read more
Author(s)
Donald Abbott,Richard Anderson,Helena Pasquito,George Wilkish,Liz Harriman,Marie Kistler,David Pinsky,Sammy Shina,Mark Quealy,Karen Walters
Event
IPC APEX 2003

Finally! Practical Guidelines for Achieving Successful Lead-Free Assembly

With the Waste Electrical and Electronic Equipment (WEEE) Directive in Europe outlawing lead from many electronic devices produced and imported in the EU by July 2006,as well as with foreign co .. read more
Author(s)
Karl Seelig,David Suraski
Event
IPC APEX 2003

Plastic Hermetic Packages for MEMS,MOEMS and Optoelectronic Devices?

The full hermetic package for electronics and optoelectronic (OE) devices was first developed in the 1800’s and has served these industries well. The earliest optoelectronic devices,cathode ray .. read more
Author(s)
Ken Gilleo
Event
IPC APEX 2003

Development of MEMS on Printed Wiring Board Platform

A new type of Micro-Electro-Mechanical System (MEMS) structure has been developed on a printed wiring board (PWB) platform. PWB,embedded passives (EP) and High Density Interconnect (HDI) techno .. read more
Author(s)
Keryn Lian,Shawn O'Rourke,Manes Eliacin,Claudia Gamboa,Robert Terbrueggen,Daniel Sadler,Marc Chason
Event
IPC APEX 2003

Mems Packaging: Challenges and Opportunities

One of the greatest obstacles in commercialization of MEMS is the cost of packaging and assembly. Packaging needs for MicroSystems and MEMS technology vary by structure and application. Major i .. read more
Author(s)
E. Jan Vardaman
Event
IPC APEX 2003

MEMS-Based Microsystem Packaging

Sandia National Laboratories has programs covering the range of MEMS technologies from LIGA to bulk to surface micromachining. These MEMS technologies are being considered for an equally broad .. read more
Author(s)
Jonathan S. Custer
Event
IPC APEX 2003

ESD – Steps Against Electrostatic Discharge – Prevention of Electronic Devices and Assemblies

Electronic devices become more and more smaller. Electronic assemblies are sensitive against electrostatic discharge just as much as its smallest and most sensitive element. So protection syste .. read more
Author(s)
Dipl.-Ing. Hartmut Berndt
Event
IPC APEX 2003

State of the Art Detection and Analysis of Outgassed compounds for the Optoelectronics and Micro Assembly Industries

The outgassing level of materials (such as adhesives,composites,plastics,etc.) that are used to assemble and construct optoelectronic packages,sub-assemblies,and other electronic materials is b .. read more
Author(s)
John C. Hulteen
Event
IPC APEX 2003

Optical Switch Packaging Wire-bonding and Encapsulation Approaches

The trend in optical communications is toward all-optical Networks,which transmit,manage and route traffic over extended distances in the optical domain,without the need for power-hungry and ba .. read more
Author(s)
Val Alexandre,Basse Thierry,Salagoïty Michel
Event
IPC APEX 2003

Enhancement of CSP Mechanical Strength using Underfill or Bonding Material

Underfill technology has been used to minimize the mismatch of the Coefficient of Thermal Expansion (CTE) in flip chip technology. An extension of this application has been used to increase the .. read more
Author(s)
Sunny Zhang,Christina Chen,Shelgon Yee,AiChyun Shiah
Event
IPC APEX 2003

Implementation of No-Flow Underfills on Chip Scale Packages

Chip Scale Package (CSP) technology is growing at a rapid pace since its emergence in the electronics manufacturing industry. As the solder joint size decreases,it has become apparent that unde .. read more
Author(s)
Corey B. Franzo,Daniel F. Baldwin
Event
IPC APEX 2003

A Technique for Improving the Yields of Fine Feature Prints

A technique that enhances the release of solder paste from stencils during the print process has been developed. The technique is based on applying variable high frequency and low amplitude vib .. read more
Author(s)
Gerald Pham-Van-Diep,Frank Andres
Event
IPC APEX 2003

The Bumping of Wafer Level Packages

The relentless trend for smaller,lighter,cheaper consumer products continues to fuel the demand for new,smaller, efficient electronic packages. In recent years wafer level packaging concepts ha .. read more
Author(s)
Mark A Whitmore,Michael A Staddon,Jeffrey D Schake
Event
IPC APEX 2003

Optimization Study for Solder Pastes Used in Wafer Bumping Applications

Solder paste for use in wafer bumping applications is becoming an extremely viable technology. Yields from solder paste printing applications are approaching that of typical bumping technologie .. read more
Author(s)
Maureen Brown,Fritz Byle
Event
IPC APEX 2003

Optimizing the Supply Chain with Returnable Packaging: Solutions to Improve Profitability in the Electronics Industry

In the complex electronics industry,supply chain costs can have a major impact on a company’s profitability. Like the industrial supply chain,where costs are estimated to account for as much as .. read more
Author(s)
Andy Schumacher
Event
IPC APEX 2003

Stencil Printing Studies

Today’s SMT assemblies are being driven toward SMD’s with higher lead densities as well as smaller packages. This places additional performance requirements on the printing process. The stencil .. read more
Author(s)
William E. Coleman
Event
IPC APEX 2003

Defining Solder Paste Performance via Novel Quantitative Methods

Quantitative solder paste performance or use testing enables material formulators to focus on and maximize key material traits such as wettability and printability. These same material test met .. read more
Author(s)
Richard Lathrop
Event
IPC APEX 2003

Print Process Characterization for Fine Pitch Area Array Packages using Taguchi Techniques

The trend in electronics packaging towards product miniaturization,has forced the industry to use fine pitch area array packages instead of fine pitch leaded packages. These area array packages .. read more
Author(s)
Karthik Thenalur,Vijaykumar Ganeshan,S. Manian Ramkumar,
Event
IPC APEX 2003

Qualification of Solder Beading and Tombstoning in Passive Devices using Designed Experiments

Solder beading and tombstoning are observed increasingly with chip components as their size decreases. This is even more crucial in today’s packaging,due to the high ratio of passive components .. read more
Author(s)
Vijaykumar Ganeshan,Karthik Thenalur,S. Manian Ramkumar
Event
IPC APEX 2003

A Materials Based Solution for the Elimination of Tombstones

The drive for electronic devices to become lightweight,more portable,and posses increased functionality has driven electronic components to smaller and smaller sizes. This decease in size does .. read more
Author(s)
Brian J. Toleno,Neil Poole
Event
IPC APEX 2003

Evaluating the Use of Next Generation Reflow Profile Control for High Volume Electronics Manufacturing

In recent years,technological advances in electronics manufacturing have allowed high volume manufacturers to significantly improve process control and documentation. Manufacturers have acceler .. read more
Author(s)
John L. Evans,Bjorn Dahle
Event
IPC APEX 2003

Extending the Power of Boundary-Scan: System-Level Testing

Boundary-scan has achieved many of the goals envisioned by its original architects and today is in use in thousands of production facilities around the world to test complex digital printed cir .. read more
Author(s)
Raymond Dellecker,Pete Collins
Event
IPC APEX 2003

A Boundary-Scan Infrastructure for Linking Design and Manufacturing Test

This paper will discuss: a. Boundary scan as a key test tool that enables the leveraged test approach b. The advantages of standardizing and reusing design verification tests and PLD programs i .. read more
Author(s)
Raymond J. Balzer,Adam W. Ley
Event
IPC APEX 2003

Investigation of the Effectiveness of Automated X-ray Inspection Systems in a High Volume – Low Mix SMT Line

The advent of miniature surface mount components coupled with increasing lead counts has posed tremendous challenges during assembly. This is especially true in an Electronics Manufacturing Ser .. read more
Author(s)
Praveen Kumar Manjeshwar,Sachin Phadnis,K. Srihari,Jorge Craik
Event
IPC APEX 2003

Comparison of X-ray Inspection Systems for BGA/CCGA Quality Assurance and Crack Detection

For high reliability applications,the use of x-ray technique has become an additional inspection requirement for quality control and detection of unique defects due to manufacturing of advanced .. read more
Author(s)
R. Ghaffarian,D. Mih
Event
IPC APEX 2003

A Case Study of In-Process Inspection Methods to Improve First Pass Yields

The electronics content of many consumer products has increased substantially over the past decade. Several of the electronics added to the automobile control vehicle functions that have a dire .. read more
Author(s)
Stacey Wagner,David Clark
Event
IPC APEX 2003

Management of DPMO Metrics Reduces the Cost of PCB Assembly

Manufacturers can use DPMO metrics to reduce the cost of PCB assembly with fewer resources. DPMO data can be used for predicting the fault spectrum on future products,quoting new business,setti .. read more
Author(s)
Amit Verma
Event
IPC APEX 2003