High Density Packaging User Group – Pb-free Materials 2 Project Materials Testing of PWB Substrates to Establish Variability of Construction, Estimate Thickness and Determine Survivability through Lead Free Assembly
An important element of the High Density Packaging Users Group (HDPUG) Consortium investigation into the reliability of printed wiring board (PWB) constructed with 20 different Pb-free materials was to understand whether the materials were negatively impacted by the six reflow cycles to 260°C. A new electrical test methodology and associated automated test equipment have been developed to non-destructively measure and compare specific attributes of the PWB’s material construction that identify whether material degradation (delamination) was present. Additional features of the methodology create product construction baselines which confirm that each individual test vehicle was constructed with the same material properties,thickness and glass/resin ratio,all related to changes in dielectric material properties. The data enables the user to estimate the variability of thickness for each dielectric layer within the product construction. The study contained a total of 27 different constructions; built by three high-end Asia based PWB manufacturers. The Interconnect Stress Test (IST) test vehicles were designed to combine attributes to quantify both via reliability and materials analysis testing. Via reliability results and the statistical correlation between IST and air to air oven testing is reported in a separate paper [5]. Using two specifically designed IST coupons with via-to-via spacing of both 0.040” (1mm) and 0.032” (0.8mm),all products were constructed with 20 layers,laminated to an average of 0.115” (2.92mm),drilled with a 0.010” (0.254mm) vias,producing an aspect ratio of 12 to 1. Seven of the 20 materials were manufactured with two different glass styles and resin contents. The materials were tested on the two coupons types,both as built (non-stressed) and after 6X Pb-free (260°C) reflow (stressed). Twenty different material types were tested,which included eight high Tg,filled FR4 materials,six high Tg halogen-free FR4 materials,and six high speed materials. Correlations between the electrical testing and traditional micro sections for the presence of material damage and confirmation of dielectric thickness are detailed.