Lead Free Assembly Qualification of Stacked MicroVia Boards
Beginning July 2006,the electronic industry will enter the age of lead –free assembly and products in Europe. The removal
of lead from electronics brings massive changes for all companies in the supply chain,OEMs and contract manufacturers.
Lead Free SMT assembly poses many challenges for soldering and reflow processes. It requires significant process
optimization efforts to perform high volume manufacturing successfully and get good,reliable solder joints. Migration to
lead free assembly requires careful balancing of bill of materials with reflow profile. Double sided reflow requires careful
balancing of delta T from Side A to Side B reflow.
Cellphone assembly requires the use of thin form factor PWBs to meet the drive for miniaturization and thin,light products.
This is accomplished by using HDI- high density interconnect boards or build up technology boards. [1]. These PWBs have
stacked microvias,which are laser drilled and plated. The switch to lead free assembly requires the use of higher reflow
temperatures,so evaluation of the microvia connections after reflow is critical after assembly.
Solder joint reliability evaluations have to focus on Ball Grid array solder joint integrity,SMT packages,passive components
and connector solder joints. Rework processes are an essential part of the reliability evaluations as higher peak temperatures
for rework may affect PWB laminate,near neighbor components and package integrity.
This paper presents the results of lead free solderability qualification conducted at Kyocera-Wireless Corporation. The report
summarizes the results of X-sectional analysis,shear testing,thermal shock and temperature humidity testing of lead free
assemblies using a HDI board.
The paper summarizes the surface mount assembly evaluation conducted to ensure the stability of the laminate and microvias
through the double-sided reflow process and rework. This was evaluated as a part of the phone product qualification build.