High Phosphorous Electroless Nickel Process for Mobile Phone PWBs
An Electroless Nickel and Immersion Gold (ENIG) plating process with a middle phosphorous content nickel layer is
currently a mainstream final finishing application for mobile phone Printed Wiring Boards (PWB). As a trend according to
the worldwide market growth of mobile phones,the demand for higher resistance characteristics in corrosive environments
for ENIG finished boards has increased. Although various methods have been introduced as an evaluation method for higher
corrosion resistance,sulfurous acid gas (SO2 gas) testing is a recent area of industry focus. However,because of the
significant corrosive characteristic of SO2 gas,the conventional ENIG layer cannot tolerate this testing method,and thus has
become an area of major concern. As a result,a high phosphorous nickel ENIG plating process,which inhibits higher
resistance in a corrosive environment compared to a middle phosphorous process,is being adopted as a final finishing
method. However,several other factors of the total plating process that may influence corrosion resistance have not been
verified or fully investigated. Therefore,in this study we introduce ENIG plating layer characteristics required for higher
resistance in corrosive environments by investigating corrosion conditions of ENIG layers caused by SO2 gas testing,and
furthermore conduct observations on factors that influence these ENIG characteristics.