RoHS Substance Measurements in Complex Products
With the wide breadth of component types used in complex electronic equipment,implementation of the European Union Restriction of Hazardous Substances 2011/65/EU/ (RoHS) is a challenge. A low volume,very high mix,manufacturer of complex equipment has tens of thousands of purchased part numbers that encompass a wide range of part types including low risk common off-the-shelf parts from robust suppliers to higher risk specialty parts at niche suppliers. One expectation of the directive is that higher risk items and process materials are measured for the restricted substances. The use of a basic handheld x-ray fluorescence instrument provides a relatively fast and inexpensive way to detect restricted substances. However,interpretation of the results must be done with perspective and judgment. The results and learnings from a physical assessment program using X-ray fluorescence (XRF) analysis are discussed. Substance measurement anomalies can occur due to sample heterogeneity and interference with XRF signal generation and detection. False readings of Hg in Au and Cd in Sn are the result of known measurement artifacts,and can be identified with examination of the spectrum. Melted solder samples can give inaccurate concentration of lead due to segregation and segmentation within the sample during cooling. Plastic parts can be at risk of Cd and Pb non-compliance from pigment or plasticizers. Inaccurate measurements can result from extraneous material in the sample window. Techniques are given for measuring contamination at soldering stations,identifying SnPb or SAC solder use when the sample contains extraneous material,and tips for containing and securing samples for analysis.