Investigation of Factors Influencing SR/Cu Interface Adhesion
Solder resist (SR) is applied to the outermost layer of printed circuit boards (PCBs) for surface protection and electrical insulation. It is crucial for the reliability of PCBs to ensure robust adhesion between SR and Cu. Current PCB manufacturing employs techniques that chemically induce micro-controlled roughness on the Cu surface, considering factors such as the surface roughness of Cu, the resin content of SR, and the type of filler. Even though heat exposure is known to deteriorate SR/Cu adhesion, the response of the SR and Cu interface to thermal aging remains elusive. In this study, a series of quantitative measurements and morphological analyses were performed to reveal how thermal aging affects the interface between SR and Cu. The growth of Cu oxide during thermal aging leads to the development of a gap between the Cu and Cu oxide layers, making the SR/Cu interfaces vulnerable to delamination. The gap formation between Cu and Cu oxide can be attributed to Cu diffusion-induced Kirkendall voids, as well as differences in crystal lattice, volume, and coefficient of thermal expansion between Cu and Cu oxide.