Assessing Electronics with Advanced 3D X-ray Microscopy Techniques
This December 11, 2024 webinar showcased cutting-edge approaches for inspecting electronic assemblies using 3D X-ray microscopy, nanoscale imaging, and deep learning. Attendees learned how tools like DeepScout and advanced DL algorithms enhance image quality, support failure analysis, and streamline quality inspections across a wide range of electronic components and assemblies.