Non-Destructive Real-time Optical Metrology of OSP Coatings on Production PCBs
Organic Solderability Preservative (OSP) coatings feature among the leading surface finish options in the printed circuit board (PCB) industry because of their excellent solderability,lead-free applicability,ease of processing,and low cost. OSP coatings are primarily composed of organometallic polymer with small molecules such as fatty acids and azoles entrained during the coating deposition process. OSP coatings are deposited on the Cu features of PCBs. They are transparent across the visible spectrum and they typically range in thickness from about 0.1µm – 0.6µm.
UV-Visible absorption characterization is the most frequently used technique to estimate OSP coating thickness. This method requires that a control sample be sent through the OSP line and coated with OSP. This OSP layer is then removed from the control sample using organic solvents,the solution is analyzed,and the thickness of the original coating is inferred. The OSP thickness on the active PCB is assumed to be equivalent to that of the control sample. The method is indirect,destructive,requires control samples,and does not yield any information concerning the uniformity of the coating. Furthermore,the wet-phase preparation steps make this technique susceptible to large experimental errors.
In this contribution the use of Optical Reflectivity for direct OSP metrology will be explored. Optical Reflectivity measurements are completely non-destructive,differentiating them from other technologies used to measure OSP thickness. Typically,the small probe area ensures that individual PCB features or regions of interest can be chosen for analysis. The non-destructive nature of the measurement ensures that quantitative data from OSP coatings can be collected at any time during the PCBs lifecycle. Adverse effects due to production steps and ageing on the OSP film can readily be measured. Control samples and test coupons become redundant and the circuit board itself does not require any sample preparation following OSP deposition.