With increasing use of portable appliances such as PDA and cellular phone,changing environment of application requires higher solder joint reliability. The Cu-OSP process has been widely used for portable devices due to its benefits including good surface planarity,cheapest finish and higher drop reliability than others.
This study is about reliability according to solder materials on package with OSP finished,and is evaluated the various Ag,Cu contents and adding few special dopants.
The Inter-Metallic Compound between pad and solder material after reflow has the scallop type and is composed Cu6Sn5 by using EDS.
Investigated the 3 types fracture mode after drop strength: The first is the crack propagating along IMC layer which composed of Cu6Sn5 (interfacial fracture mode),the second is the crack propagating along solder side (bulk fracture mode); the final is the crack propagating along the above IMC layer between IMC and solder.
The unstable interface exists through IMC,pad material and solder bulk by the lattice mismatch,so that the thermal and physical stress due to the continuous exterior impact is transferred to the IMC interface.
Therefore,it is strongly requested to control solder morphology,IMC shape and thickness to improve the solder reliability. In case of increasing the Cu contents,IMC shape changed scallop type to spike type,and IMC had larger toughness by using nano-indenter.
Accelerated stress propagated along the weaken surface between solder and IMC,this phenomenon is caused to increasing drop performance.
Moreover,as the special dopants were added,the relatively weak thermal shock strength could be improved.
Author(s)
HK Lee,YC Chu,MH Chun,SH Jeon,SH Jeong