Performance of Photoimageable Solder Masks – A Study on Thermal Stress
The continuous temperature resistance of electrically insulating materials can be judged by examining the effect of thermal stress loads on the electrical properties,such as moisture and insulating resistance,tracking resistance,etc.
Which effects on the electrical insulating properties of solder masks are to be expected,in particular under subsequent climatic stress? This paper will present and discuss the results of moisture and insulating resistance tests in different climates as well as further electrical properties from both continuous storage tests at 150°C for 2,000 hours and thermal cycling tests over 1,000 cycles,-40°C/+150°C. The load at the high cycle temperatures shall be compared with those from the continuous temperature storage tests. Furthermore,the theoretical base of this methodology shall be discussed.
In order to consider any potential "pre-damage" caused by the various surface finishes,tests have also been performed with a "preliminary stress load" comparable to that of the printed circuit board and electronic assembly. The influences of processing with various surface finishes such as Nickel/Gold finish (ENIG),chemical tin finish (CSN) and HAL (Hot-Air Levelling) on the thermal cycling resistance have also been examined. The paper shall go on to discuss investigations into the moisture and insulation resistance in different climates as well as the influence of the base material and layout as well as precleaning and solder mask thickness on the thermal cycling resistance.
In addition,comparisons shall be made between aqueous-alkaline and polyalcohol developable materials.