Experience in Processing EEE Components with Pure Electroplated Tin Leads As a
The regulatory measures defined in MIL performance standards that govern production of active and passive electronic components ban the application of pure Sn plated leads for EEE parts. The standards imply that the top coating of the
component leads can contain a maximum of 97% of Tin and a minimum of 3% of Lead as an alloying element. The alloying element reduces the internal stresses present in the pure Tin electroplated coatings and diminishes one of the known causes for whisker growth. However,there are still EEE components on the market that are produced with pure Tin coating on the leads. Some of these components represent an intrinsic part of the successful final product with no viable substitutes.
Experience gained in processing the components,in order to make them flight worthy,highly reliable and whisker free,is used in facilitating a transition from Lead solder to Lead free PCA manufacturing. As a result,a positive trend of removing Lead from the first and second level of electronic interconnects is adopted regardless of the currently applicable exemptions for space industry.
This paper presents experimental data collected on pure Tin plated parts and whiskers grown in the period 1991 –2001 on EEE parts; test results confirming material condition producing whiskers growth trends,dimensional analysis and related processing steps used for annulling generation of whiskers are also performed. The successful processing of the related component,and reported experimental data established grounds for challenging the NASA STD 8739.3 statement on limitations of the minimal spacing from the component body for soldering of leads.
Furthermore,the analysis and qualification test results of the particular non SAC solder considered as a potential replacement of Lead containing solders for space application is elaborated for standard electronic assemblies configurations and thermal regimes. A new prospective,affirmed by qualification test data of using this solder for harness interconnects at cryogenic temperature environment also presented.