This paper provides an assembly process comparison of Pb-free alloys with a Sn/Pb alloy using a test vehicle
designed to resemble real world manufacturing applications. Four different Pb-free alloy systems,including two
compositions in the Sn/Ag/Cu alloy system,are investigated,and their board level assembly processing
characteristics are compared to the eutectic Sn/Pb alloy for a variety of surface mount components and packages,
and through-hole components. Presumably,Pb-free technology will adopt the same family of components,with
alterations only in their package materials. The key advantage of this approach is that the focus is on evaluating the
Pb-free manufacturing process and verifying its capability,independent of a specific component. As a result,a
matrix of different families of components,such as chip components,peripherally leaded components,ball grid
array packages,and chip scale packages with varied pitch sizes has been incorporated. The components were
assembled on printed circuit boards having five different Pb-free surface finishes. The sequential approach has been
adopted that involves the design of the test vehicle and component selection,comparison of printing characteristics
for Pb-free pastes,and comparison of processing defects. This paper is a follow-up to one that appears in the
proceedings of the 2003 Pan Pacific Microelectronics Conference. The earlier paper discussed in detail the design of
the test vehicle,stencil design and comparison of printing characteristics for Pb-free pastes. This paper discusses the
comparison of processing defects. The results of the assembly process defects are based on visual and x-ray
inspection of the assembled boards. Finally,a performance index is calculated to provide a relative comparison of
different combinations of Pb-free alloys and alternative surface finishes.