Reliability of Ball Grid Arrays Converted from Pb-free to Tin-Lead by Robotic Hot Solder Dip (RHSD). Multiple Reball Trial and Test Results
Pb-free Ball Grid Arrays (BGA) present unacceptable reliability risks for defense and space programs,but what are the options when SnPb devices are no longer available? BGA manufacturers express concern over the additional reflow cycles necessary for the reballing process. In addition,traditional re-balling processes for SnPb components requiring rework do not accomplish the complete flush of the existing alloy necessary prior to attaching new spheres. However,there is evidence that BGAs,as a rule,are very robust. Furthermore,an imminent industry specification,IEC/TS 62647-4,Process Management for Avionics –Aerospace and Defense Electronic Systems Containing Lead-Free Solder –Part 4: Ball grid array (BGA) Re-balling,provides guidance necessary to successfully convert Pb-free spheres to SnPb without thermal or mechanical damage. An examination of one BGA part type,reballed up to ten times,provides a view of IEC/TS 62647-4 type guidance and testing as well as the impact of multiple reballing attempts on the BGA. Barring another available specification for reballing,this specification was used for structure in this study